Technical Resources
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VersaProbe 4 Scanning XPS Microprobe: Unique Instrument for Battery Characterisation
Use of Lab-based HAXPES to Eliminate the Effect of Ion Beam Damage at Interfaces in Depth Profiles
Organic Depth Profiling with the PHI Model 06-C60 Sputter Ion Gun
Probing Interfaces in Fuel Cell Electrodes by XPS and HAXPES
Complementary XPS and TOF-SIMS for Organic Analysis
Cleaning Polymer Surfaces with the PHI 06-C60 Sputter Ion Gun
Characterisation of Graphene using XPS and REELS
Mosaic Mapping for Analysis of Heterogeneous Battery Degradation
XPS and TOF-SIMS for the Pharmaceutical Industry
WinCadence Compound Identification Tool
Tuning the Matsuda Voltage of the Trift Spectrometer to Optimise the Mass Accuracy for Peak Identification
TOF-SIMS Characterisation of Multi-Layer Paint Coatings
TOF-SIMS Imaging of High Mass Oligomers Localised to Marine Aerosol Particle Surfaces
TOF-SIMS Molecular Imaging of a Micropatterned Biological Ligand
TOF-SIMS Imaging of a Drug Pellet - Cross-Section Using a Bi₃² + Cluster Ion Beam
TOF-SIMS Chemical Imaging of Metal Interconnects on a Flexible Organic Substrate
TOF-SIMS Analysis of the Glass Phase in Alumina-Zirconia-Silica (AZS) Materials
TOF-SIMS Analysis of Organic LED Thin Films
Time-of-Flight Secondary Ion Mass Spectrometry
