Scanning Electron Microscopes

SEM systems with a superior price to performance ratio, and impressive ease of use.

Benchtop/Tabletop

High-resolution scanning electron microscopes (SEM) with ease of use guaranteed. Includes a motorised 3-axis XYT sample stage as standard, making it efficient and easy to control the position of the sample while in the chamber.

EM-40

EM-40

EM-30N

EM-30N

Full-Size

The CX-200 is a full-size, floor model scanning electron microscope (SEM) that both new and experienced users will find suitable for many types of demanding research and quality control requirements.  

Microscopes

Microscopes

Hardware Options

Hardware Options

Consumables

Consumables

Cross Section Polisher

An advanced sample preparation tool that etches a cross section of a sample using an argon ion beam.

CP-8000+

CP-8000+

Coaters

Th​e ion co​ater, SPT-20, is a device used for coating conductive materials onto the sample surfaces by using DC sputtering princi​ple.

Coaters

Coaters

Replacement Targets

Replacement Targets

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