Scanning Electron Microscopes
SEM systems with a superior price to performance ratio, and impressive ease of use.
Benchtop/Tabletop
High-resolution scanning electron microscopes (SEM) with ease of use guaranteed. Includes a motorised 3-axis XYT sample stage as standard, making it efficient and easy to control the position of the sample while in the chamber.
EM-30 Plus & LE Benchtop Scanning Electron Microscope
EM-30 Plus & LE Benchtop Scanning Electron MicroscopeEM-30AX Plus & LE Desktop Scanning Electron Microscope with EDS
EM-30AX Plus & LE Desktop Scanning Electron Microscope with EDSFull-Size
A full-size, floor model scanning electron microscope (SEM) that both new and experienced users will find suitable for many types of demanding research and quality control requirements.
Cross Section Polisher
An advanced sample preparation tool that etches a cross section of a sample using an argon ion beam.
Coaters
The ion coater, SPT-20, is a device used for coating conductive materials onto the sample surfaces by using DC sputtering principle.