Scanning Electron Microscopes

SEM systems with a superior price to performance ratio, and impressive ease of use.

Benchtop/Tabletop

High-resolution scanning electron microscopes (SEM) with ease of use guaranteed. Includes a motorised 3-axis XYT sample stage as standard, making it efficient and easy to control the position of the sample while in the chamber.

EM-40

EM-40

EM-30N

EM-30N

Full-Size

A full-size, floor model scanning electron microscope (SEM) that both new and experienced users will find suitable for many types of demanding research and quality control requirements.  

CX-200 Plus Scanning Electron Microscope

CX-200 Plus Scanning Electron Microscope

Cross Section Polisher

An advanced sample preparation tool that etches a cross section of a sample using an argon ion beam.

CP-8000+

CP-8000+

Coaters

Th​e ion co​ater, SPT-20, is a device used for coating conductive materials onto the sample surfaces by using DC sputtering princi​ple.

SPT-20 - Ion Sputter Coater

SPT-20 - Ion Sputter Coater

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