Scanning Electron Microscopes
State-of-the-art Scanning Electron Microscopes and SEM systems from Coxem. Superior price to performance ratio, and impressive ease of use.
Benchtop/Tabletop
High-resolution scanning electron microscopes (SEM) with ease of use guaranteed. Includes a motorised 3-axis XYT sample stage as standard, making it efficient and easy to control the position of the sample while in the chamber.
Full-Size
The CX-200 is a full-size, floor model scanning electron microscope (SEM) that both new and experienced users will find suitable for many types of demanding research and quality control requirements.
Cross Section Polisher
An advanced sample preparation tool that etches a cross section of a sample using an argon ion beam.
Coaters
The ion coater, SPT-20, is a device used for coating conductive materials onto the sample surfaces by using DC sputtering principle.