Surface Analysis
Powerful surface analysis instruments from the world's leading supplier of UHV surface analysis instrumentation. PHI’s innovative XPS, AES, and SIMS technologies provide unique tools to solve challenging materials problems and accelerate the development of new materials and products.
Scanning XPS/HAXPES Microprobe
Fully automated multi-technique scanning XPS/HAXPES microprobe
Time-of-Flight SIMS
A TOF-SIMS instrument optimised for the highest sensitivity elemental and molecular analysis
Scanning Auger Nanoprobe
A scanning Auger instrument optimised for high magnification chemical imaging
