Nano Indenters
A complete portfolio of nanomechanical testers for materials characterisation and process control.
Benchtop/Tabletop
Freestanding
In-situ
Universal Testing Machine
Nano Indenter Comparison
| Product Range | ||||
| iNano | iMicro | G200 | G200X | |
|
Lab Facility |
||||
| R&D failure labs with targeted focus | Yes | Yes | Yes | Yes |
| R&D and failure labs with multiple requirements | Yes | Yes | Yes | |
| Multi-user faclities | Yes | Yes | ||
|
Force Range |
||||
| 50mN | Yes | Yes | Yes | Yes |
| 1N | Yes | Yes | Yes | |
| 10N | Yes | |||
|
SPM & Mapping |
||||
| High speed indentation mapping | Yes | Yes | Yes | Yes |
| Scanning probe microscopy | Yes | Yes | ||
| Survey Scanning | Yes | Yes | ||
|
Targeting Accuracy |
||||
| 5μm | Yes | Yes | Yes | Yes |
| <5μm | Yes | Yes | Yes | |
| <1μm | Yes | Yes | ||
| <20nm with NanoVision | Yes | Yes | ||
|
Stage Translation |
||||
| 75mm X 75mm | Yes | Yes | Yes | Yes |
| 100mm X 100mm | Yes | Yes | Yes | |
| 200mm X 200mm | Yes | Yes | ||
|
Displacement Range |
||||
| lnForce50: 50μm (0.2pm Resolution) | Yes | Yes | Yes | |
| lnForce1000: 80μm (0.04nm Resolution) | Yes | Yes | ||
| DCM II: 70μm (0.2pm Resolution) | Yes | |||
| XP: 1.5mm (0.01nm Resolution) | Yes | |||
| >25mm Z-axis (<50nmResolution) | Yes | Yes | Yes | |
|
Force Range |
||||
| lnForce50: 50mN (3nN Resolution) | Yes | Yes | Yes | |
| lnForce1000: 1N (6nN Resolution) | Yes | Yes | Yes | |
| DCM II: 30mN (3nN Resolution) | Yes | |||
| XP: 500mN_10N optional (50nN Resolution) | Yes |