Technical Resources
Welcome to our technical resources, simply select a category, product and media type to enter keyword for resources to show.
Zeta-388 Optical Profiler Brochure
Zeta-388 Optical Profiler Product Specifications
Objective Lens Selection
Measurement of Deep Trenches to Study the RIE Lag Effect
3D Surface Roughness Characterisation
Closed Channel Optical Metrology for Microfluidics Applications
ZDot™ Technology
ZDot™
The ZDot™ technology also simplifies operation and setup, by projecting a focusing onto the samples top and bottom surfaces. When the top or bottom surface is correctly focused, the ZDot™ grid will appear in the highest contract, making it fast and intuitive to correctly set up samples. The Zeta-388 is easy to operate, even for less experienced users.
Shown left: The ZDot™ grid visible when the bottom surface is in focus
Shown Right: The ZDot™ grid visible when the top surface is in focus
Automated Process Metrology in Solar Cell Manufacturing
Measurements with 3D Non-contact Optical Profilometry
Texture Process Monitoring in Solar Cell Manufacturing Using Optical Metrology
Recent Major advances IN 3D Optical Profiling of Micro Surfaces
Measuring Sealed Micro Fluidic Devices — Yes, It Can Be Done!
