Technical Resources
Welcome to our technical resources, simply select a category, product and media type to enter keyword for resources to show.
Objective Lens Selection
Measurement of Deep Trenches to Study the RIE Lag Effect
3D Surface Roughness Characterisation
Closed Channel Optical Metrology for Microfluidics Applications
ZDot™ Technology
Zeta-300 True Colour 3D Optical Profiler Brochure 2023
ZDot™
The ZDot™ technology also simplifies operation and setup, by projecting a focusing onto the samples top and bottom surfaces. When the top or bottom surface is correctly focused, the ZDot™ grid will appear in the highest contract, making it fast and intuitive to correctly set up samples. The Zeta-388 is easy to operate, even for less experienced users.
Shown left: The ZDot™ grid visible when the bottom surface is in focus
Shown Right: The ZDot™ grid visible when the top surface is in focus
Automated Process Metrology in Solar Cell Manufacturing
Measurements with 3D Non-contact Optical Profilometry
Texture Process Monitoring in Solar Cell Manufacturing Using Optical Metrology
Recent Major advances IN 3D Optical Profiling of Micro Surfaces
Measuring Sealed Micro Fluidic Devices — Yes, It Can Be Done!
