Nano-Observer II
The Nano-Observer II is a cutting-edge Atomic Force Microscope (AFM) that combines flexibility, exceptional performance, and user-friendly operation. Designed for both advanced users and beginners, it offers a wide range of capabilities for nanoscale imaging and characterisation.
Key Features
- User-Friendly Design
- AutoScan Software: Easier & Faster Automated Scan
- High-Performance Scanning
- Advanced AFM Modes
- Advanced Technology Integration
- Open design for integration of optical microscopy techniques
Manufacturer
CSI
CSInstruments is a French scientific equipment manufacturer specialised in the conception of Atomic Force Microscope and options designed for existing AFM (Nano-Observer AFM, Resiscope™, High Voltage Amplifier, Magnetic modules). The product range proposed by CSInstruments is designed and manufactured to help the scientific community to achieve nanometre performances that meet the research needs and requirements for actual and future nanoscience applications.
CSInstruments was founded by a team of experts working in AFM field for more than 20 years, starting as pioneer with some historical manufacturers. CSInstruments activity is also based on a qualified and dynamic team, experienced in the fields of mechanics, electronics and data processing. This expertise ensures innovation and performance in the production of AFM and achieves an excellent price/performance ratio!
Various Application Fields With Different Scan Modes
Advanced Electrical Modes:
- Resiscope (current & resiscope mapping)
- HD-KFM (auto optimised single pass KFM)
- sMIM (capacitance/permittivity & resistivity/conductivity variations...)
Mechanical Properties:
- Soft IC mode (stiffness & adhesion)
- Force modulation mode (elastic and viscoelasticity)
Atomic Force Microscopy Modes:
- Electric Force
- Conductive AFM (current mapping)
- Contact & no contact modes
Resiscope: Current & Resistance Mapping
What is Resiscope?
The ResiScope is a unique, true active and fast system able to measure Resistance over 10 decades with a high sensitivity and resolution. True fast auto ranging driven by Digital Signal Processor (DSP). It can be combined with several dynamic modes as MFM/EFM or KFM single pass providing several sample characterisations on the same scan area.
- Resistance & Current mapping over 10 orders of magnitude in one module and one pass
- Current control
- High sensitivity over the full range
- Compatible with :
Oscillating mode / AC mode
EFM / MFM
HD-KFM
HD-KFM - High Definition Kelvin Force Microscopy
In addition to standard KFM, the Nano-Observer II can offer High Definition KFM mode to highly enhance the resolution and increase the sensitivity of the surface potential.
The Electric Field Cancelling is a technique to compensate in real time the electrostatic field between the tip and the sample to achieve a pure magnetic measurement (MFM)
Soft Intermittent-Contact Mode (Soft-IC) The 3rd AFM mode Advanced Surface Characterisation
A Breakthrough in AFM Technology for Comprehensive Sample Analysis
The Soft-IC mode operates at lower frequencies than traditional AFM, allowing the probe tip to make controlled, intermittent contact with the sample surface. This precise Z-piezo movement maintains constant force during measurement before retracting to the next point, enabling accurate mechanical and electrical property measurements while minimising sample damage. By combining the advantages of both contact and resonant AFM modes, Soft-IC excels at characterising soft biological samples and abrasive materials without compromising measurement quality or sample integrity. Compatible with various probe tips, this versatile technique delivers quantitative data while protecting both sample and probe.
Soft MEKA (Soft IC + Mechanical measurement)
Soft Meka allows you to obtain high resolution imaging of stiffness or adhesion. By setting a lift height higher than the adhesion force, the tip can be totally disengaged from the surface and permit to obtain stiffness and adhesion from every measured point. In addition, the stiffness can be used in combination with a software module to calculate the Young modulus.
Soft IC + Resiscope = Soft Resiscope
The Soft ResiScope is a specialised AFM technique engineered for precise electrical characterisation of fragile conductive samples. During operation, the system executes controlled vertical movement and keeps the force constant during the current/resistance measurement so that a quantitative conductive measurement is performed. Unlike traditional contact mode ResiScope, the Soft ResiScope measures also quantitatively resistance and current, avoiding the effects of friction either on the tip or the sample.
What sets this technique apart is its ability to deliver measurement quality comparable to traditional contact-mode AFM while extending these capabilities to delicate samples that would typically be damaged by continuous contact. This innovation bridges a critical gap in nanoscale electrical characterisation, making previously challenging measurements routine and reliable.
The Soft IC is also compatible with other AFM modes such as Scanning Thermal Microscopy(SThM) and Piezoresponse Force Mode (PFM) with similar benefits as Soft ResiScope, i.e. it avoids friction however it keeps the force constant during the thermal or piezoelectric measurement. It extends the capability to measure delıcate samples ın an easier and reliable manner.
Soft PFM
- Measuring amplitude and phase signals for fragile samples
- Intermittent Contact mode + PFM
Soft SThM
- Thermal conductivity measurements for delicate samples
- Intermittent Contact mode + SThM
ResiScope™ III Advanced Electrical Measurements for AFM
ResiScope™ III is the most advanced module for electrical measurements at the nanoscale, building upon the proven ResiScope™ technology with enhanced capabilities.
Features:
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AutoGain adjusted in real-time by ultra-fast Digital Signal Processor electronics
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10 orders of magnitude range in current/resistance (50 fA to 1mA - 100 ohms to 1 Tohm)
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Both highly conductive and highly isolating domains measured in same image without user adjustment
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No logarithmic amplifiers/gains (Multiple linear gains)
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Real-time current protective integrated system
ResiScope™ III Enhancements:
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Superior accuracy and reduced background noise
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PFM + ResiScope simultaneous measurements
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Full integration with NanoSolution software
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Access to all new future features and updates
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Enhanced compatibility with advanced AFM modes, conductors, photovoltaics, and advanced materials science
HD-KFM™ III Advanced Surface Potential Measurements
HD-KFM™ III builds upon our proven HD-KFM™ technology, offering enhanced capabilities for precise surface potential measurements. This advanced module delivers superior resolution and new functionalities for comprehensive surface analysis.
All HD-KFM™ Capabilities:
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True non-contact mode measurement
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Multi-frequency excitation
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Precise surface potential measurements
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Direct VCPD measurement
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Real electrostatic gradient measurements
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AM/FM modes available
HD-KFM™ III Enhancements:
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Enhanced resolution with better signal-to-noise ratio
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Simultaneous KFM Moiré measurements
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EFM/dC/dZ capabilities
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Full integration with NanoSolution software
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Access to all new future features and updates
Scanner Specifications
| XY Scan Range | 100 μm × 100 μm (±10%) |
| Z Range | 15 μm (±10%) |
| XY Drive Resolution | 0.06 Angströms |
| Z Drive Resolution | 0.06 Angströms |
Imaging Modes
| Standard Modes | Contact, Resonant, Soft Intermittent Contact |
| Magnetic Modes | Magnetic Force Microscopy, Variable Magnetic Field Module |
| NanoMechanical Modes | Soft MEKA, Force Modulation, Nano-Indentation, Force Spectroscopy, Friction (LFM) |
| Electrical Modes (AC) | HD-KFM III, Kelvin Force Microscopy (double-pass), Electrostatic Force Microscopy |
| Electrical Modes (DC) | ResiScope™ III, Soft ResiScope, Conductive AFM, Scanning Microwave Impedance, Piezo Response Force Microscopy |
Electrical Measurements
| ResiScope Range | 102 to 1012</up> ohms |
| Voltage Range | ±10 V (adjustable) |
Controller and Data Acquisition
| Controller Resolution | 24-bit |
| Built-in Lock-in Amplifier | Up to 6 MHz |
| Maximum Data Points | 8192 × 8192 |
Sample Stage
| Sample Size | Up to 50 mm (2 inches) diameter |
| Sample Height | Up to 20mm |
| Motorised Sample Approach | 20 mm range |
Environmental Control
| Temperature Range | -40°C to 300°C (with optional module) |
| Humidity Control & Gas Control | Optional |
| Liquid Cell | Available for fluid imaging |
Electrochemical AFM (EC-AFM)
| Electrochemical Cell | Three-electrode configuration |
| Potential Range | ±10 V |
Software
| Operating System Compatibility | Windows 10/11 |
| AutoScan Feature | Automated imaging with three-click operation |
| Real-time Data Processing & Analysis |
Applications
Materials Science
The Nano-Observer AFM series is tailored for materials science applications, delivering precise nanoscale analysis of surface morphology, mechanical properties, and electrical behaviour. Equipped with advanced techniques such as ResiScope and HD-KFM III, it supports the investigation of a wide range of materials, from nanocomposites to functional coatings. Ideal for both research and industrial development, it ensures reliable, high-resolution results to drive innovation in materials engineering.
Polymers
The Nano-Observer AFM series delivers high-precision polymer analysis, revealing surface morphology, mechanical properties, and electrical characteristics at the nanoscale. With advanced techniques like Soft ResiScope and HD-KFM, it supports applications from polymer development to quality control, ensuring reliable, high-resolution results for research and industry.
Semiconductors
The Nano-Observer AFM series is a powerful tool for semiconductor research, offering unparalleled precision in surface morphology, electrical characterisation, and mechanical property analysis at the nanoscale. Utilising cutting-edge techniques such as HD-KFM III and ResiScope, it enables detailed studies of semiconductor materials, from advanced device fabrication to quality assurance. Designed for both research and industrial applications, it ensures accurate, high-resolution data to drive innovation in semiconductor technology.
2D Materials
The Nano-Observer AFM series is a cutting-edge solution for the analysis of 2D materials like graphene, hBN, and transition metal dichalcogenides. It offers unparalleled precision in characterising surface morphology, mechanical properties, and electrical behaviour at the nanoscale. With advanced modes such as HD-KFM III and ResiScope, it enables detailed investigations of these materials' unique properties, supporting both fundamental research and industrial development in nanotechnology and advanced material applications.
Biology
The Nano-Observer AFM series provides exceptional capabilities for analysing biological samples, offering nanoscale insights into surface morphology, mechanical properties, and molecular interactions. With advanced techniques like Soft ResiScope and liquid imaging modes, it ensures precise characterisation of delicate biological structures, from cells to biomolecules. Designed for both research and applied science, it delivers reliable, high-resolution data essential for breakthroughs in biotechnology and life sciences.
Energy Materials
The Nano-Observer AFM series excels in the analysis of renewable energy materials, offering high-precision characterisation of surface morphology, electrical properties, and mechanical behaviour at the nanoscale. With advanced techniques like HD-KFM III and ResiScope, it is ideal for studying photovoltaics, battery materials, and energy storage systems. Supporting both research and industrial applications, it provides reliable, high-resolution data to accelerate innovation in sustainable energy technologies.
Downloads
Nano-Observer II Brochure
Characterisation of Solid-State Polymer Batteries
Photovoltaic Materials Characterisation
Characterisation of 2D Materials With Advanced AFM Techniques
Related Products
Service Support
Comprehensive repairs and servicing
Annual Support Programs
Your metrology instrumentation is a major investment that is critical to your business operation and success. In today’s competitive climate, it is more important than ever to extend the functionality and peak performance of your metrology equipment years beyond the expiration of your factory warranty. CN Tech’s Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.
With over 20 years’ experience servicing and repairing you can be assured that your system is in safe hands. The independent services we offer include system relocation, maintenance visits, parts and consumables, and break down interventions.
CN Tech’s Support Programs are an economical way to guarantee optimal working condition:
- Annual Preventive Maintenance
- Priority Technical Assistance
- Preferred Parts Availability
- On-Site User Training
- Remote Diagnostics
- No surprise repair expense and much more!
Support Contact Example
An example of our service and support contracts are shown below:
Metrology & Instrumentation Annual Support Programs 2024/25
CN Tech's Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.