Magnetic Force Microscopy

Magnetic Force Microscopy

Magnetic Force Microscopy (MFM) is an Atomic Force Microscopy (AFM) technique that allows for high-resolution mapping of magnetic force gradients at the nanoscale. This mode is crucial for studying magnetic materials, data storage devices, and a wide range of magnetic phenomena.

Manufacturer

CSI

CSInstruments is a French scientific equipment manufacturer specialised in the conception of Atomic Force Microscope and options designed for existing AFM (Nano-Observer AFM, Resiscope™, High Voltage Amplifier, Magnetic modules). The product range proposed by CSInstruments is designed and manufactured to help the scientific community to achieve nanometre performances that meet the research needs and requirements for actual and future nanoscience applications.

CSInstruments was founded by a team of experts working in AFM field for more than 20 years, starting as pioneer with some historical manufacturers. CSInstruments activity is also based on a qualified and dynamic team, experienced in the fields of mechanics, electronics and data processing. This expertise ensures innovation and performance in the production of AFM and achieves an excellent price/performance ratio!

Key Features

  • High Sensitivity: Detect even the weakest magnetic domains and structures
  • Excellent Spatial Resolution: Achieve lateral resolution down to 20 nm
  • Non-Destructive Imaging: Ideal for studying sensitive magnetic samples
  • Quantitative Measurements: Map relative strengths of magnetic fields across surfaces
  • Integration with Other Modes: Combine MFM with electrical or mechanical property mapping

How does MFM work?

MFM operates as a two-pass scanning technique:

  1. Topography Scan: A magnetically coated tip first scans the surface to record topography in tapping mode.

  2. Lift Mode: The tip is then raised to a specific height above the sample (typically 20-100 nm).

  3. Magnetic Force Detection: As the tip follows the topography at this constant height, it detects long-range magnetic forces.

  4. Data Recording: The system records the phase shifts of the cantilever oscillation, which correspond to the magnetic force gradient.

This two-pass technique allows for separate optimisation of topographical and magnetic measurements, ensuring high-quality data for both.

Specifications

Lift Height Range 10 nm - 200 nm
Lateral Resolution < 20 nm (tip-dependent)
Optional Variable magnetic field module for in-situ studies
Compatible with all CSInstruments AFM systems

Industries

  • Materials Science
  • Life Sciences
  • Semiconductors and Electronics
  • Academics
  • Others (includes solar cells, geoscience, forensic science, and food technology)

 

Applications

Data Storage

  • Characterisation of magnetic recording media
  • Analysis of bit patterns in hard drives
  • Development of next-generation magnetic storage technologies

Semiconductor Industry

  • Inspection of magnetic sensors and MEMS devices
  • Failure analysis in magnetic components

Materials Science

  • Study of magnetic domain structures in various materials
  • Investigation of magnetic thin films and multilayers
  • Characterisation of novel magnetic nanomaterials

Spintronics

  • Research on spin-dependent transport phenomena
  • Development of spintronic devices

Geoscience

  • Analysis of magnetic properties in geological samples
  • Study of magnetic inclusions in minerals

Downloads

Application Notes

Magnetic Force Microscopy Mode Application Note

View Application Note

Service Support

Comprehensive repairs and servicing

Annual Support Programs

Your metrology instrumentation is a major investment that is critical to your business operation and success. In today’s competitive climate, it is more important than ever to extend the functionality and peak performance of your metrology equipment years beyond the expiration of your factory warranty. CN Tech’s Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.

With over 20 years’ experience servicing and repairing you can be assured that your system is in safe hands. The independent services we offer include system relocation, maintenance visits, parts and consumables, and break down interventions.

CN Tech’s Support Programs are an economical way to guarantee optimal working condition:

  • Annual Preventive Maintenance
  • Priority Technical Assistance
  • Preferred Parts Availability
  • On-Site User Training
  • Remote Diagnostics
  • No surprise repair expense and much more!

Support Contact Example

An example of our service and support contracts are shown below:

Brochures

Metrology & Instrumentation Annual Support Programs 2024/25

CN Tech's Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.

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