Kelvin Force Microscopy
Kelvin Force Microscopy (KFM) is a powerful technique in Atomic Force Microscopy (AFM) for mapping surface potential and work function variations with nanoscale resolution. This mode is critical for semiconductor, photovoltaic, and nanotechnology applications, offering insights into the electrical properties of materials.
Manufacturer
CSI
CSInstruments is a French scientific equipment manufacturer specialised in the conception of Atomic Force Microscope and options designed for existing AFM (Nano-Observer AFM, Resiscope™, High Voltage Amplifier, Magnetic modules). The product range proposed by CSInstruments is designed and manufactured to help the scientific community to achieve nanometre performances that meet the research needs and requirements for actual and future nanoscience applications.
CSInstruments was founded by a team of experts working in AFM field for more than 20 years, starting as pioneer with some historical manufacturers. CSInstruments activity is also based on a qualified and dynamic team, experienced in the fields of mechanics, electronics and data processing. This expertise ensures innovation and performance in the production of AFM and achieves an excellent price/performance ratio!
Key Features
- High Sensitivity: Resolve minute variations in surface potential and work function
- Nanoscale Precision: Achieve detailed mapping at sub-nanometre resolution
- Multimode Capability: Combine KFM with other AFM modes for comprehensive analysis
- Non-Destructive Imaging: Ideal for fragile or delicate samples
- Advanced Applications: Semiconductors, 2D materials, and organic electronics
How does KFM Mode AFM work?
Kelvin Force Microscopy operates by detecting the electrostatic forces between a conductive AFM tip and the sample surface. A feedback loop minimises these forces, allowing precise mapping of the surface potential. Advanced KFM techniques, such as single-pass KFM, enhance efficiency and resolution.
HD-KFM III: The Most Advanced Single-Pass KFM Mode
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Single-Pass Operation: Simultaneously measure topography and surface potential, reducing measurement time and enhancing accuracy.
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dC/dZ Measurements: Characterise local dielectric properties by analysing the capacitance gradient with respect to tip-sample distance.
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Lift Mode: Accurately measure surface potential while separating long-range electrostatic forces.
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EFC (Electrical Field Compensation): Eliminate electrostatic interactions during MFM measurements for pure magnetic imaging.
Specifications
| Scanning Modes | Single-pass KFM, Lift Mode KFM |
| Resolution | Sub-nanometre in vertical resolution |
| Applications | Surface potential mapping Work function analysis Electrical heterogeneity mapping |
Industries
- Materials Science
- Life Sciences
- Semiconductors and Electronics
- Academics
- Others (includes solar cells, geoscience, forensic science, and food technology)
Applications
Semiconductor Analysis
- Map dopant distributions and device interfaces
- Analyse charge trapping and leakage mechanisms
Photovoltaics Research
- Evaluate surface potential in perovskite and organic solar cells
- Optimise materials for improved device efficiency
Nanotechnology and Materials Science
- Investigate 2D materials and nanoscale composites
- Study work function variations in advanced materials
Related Products
Service Support
Comprehensive repairs and servicing
Annual Support Programs
Your metrology instrumentation is a major investment that is critical to your business operation and success. In today’s competitive climate, it is more important than ever to extend the functionality and peak performance of your metrology equipment years beyond the expiration of your factory warranty. CN Tech’s Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.
With over 20 years’ experience servicing and repairing you can be assured that your system is in safe hands. The independent services we offer include system relocation, maintenance visits, parts and consumables, and break down interventions.
CN Tech’s Support Programs are an economical way to guarantee optimal working condition:
- Annual Preventive Maintenance
- Priority Technical Assistance
- Preferred Parts Availability
- On-Site User Training
- Remote Diagnostics
- No surprise repair expense and much more!
Support Contact Example
An example of our service and support contracts are shown below:
Metrology & Instrumentation Annual Support Programs 2024/25
CN Tech's Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.