Galaxy Dual Controller
The GALAXY DUAL controller creates new opportunities for AFM users by combining new features with those already available on your existing AFM. This new controller offers more than a second life to your AFM, it renews and improves the performance with new imaging modes and new intuitive software.
Key Features
- Cost Effective: Enhance your AFM without investing in an entirely new system
- Expanded Capabilities: Access new modes & measurements previously unavailable on older platforms
- High-Resolution Performance: USB 24-bit drive architecture, low-noise electronics, and real integrated lock-ins
- User-Friendly Software: Streamlined NanoSolution interface with auto-setup or advanced manual controls
- Seamless Compatibility: Supports a range of older AFM/STM bases, including Multimode, 5100, 5500, 5600LS, and 54xx lines
- High-Performance Hardware
Manufacturer
CSI
CSInstruments is a French scientific equipment manufacturer specialised in the conception of Atomic Force Microscope and options designed for existing AFM (Nano-Observer AFM, Resiscope™, High Voltage Amplifier, Magnetic modules). The product range proposed by CSInstruments is designed and manufactured to help the scientific community to achieve nanometre performances that meet the research needs and requirements for actual and future nanoscience applications.
CSInstruments was founded by a team of experts working in AFM field for more than 20 years, starting as pioneer with some historical manufacturers. CSInstruments activity is also based on a qualified and dynamic team, experienced in the fields of mechanics, electronics and data processing. This expertise ensures innovation and performance in the production of AFM and achieves an excellent price/performance ratio!
New opportunities with 5100/ 5500/ Multimode, AFM/STM bases
The GALAXY DUAL USB controller offers a real integrated lock-in for better measurement capability (phase detection, field measurement…). Low-noise electronics and power supply coupled to a 24bit drive architecture provides high resolution and smart integration.
Keep your existing AFM modes
The dual galaxy controller has been designed to be fully compatible with:
– Multimode AFM
– Pico SPM (STM)
– 5100 AFM
– 5500 AFM
– STM, Contact, AC, Phase, MFM/ EFM/ PFM,/LFM, EC modes
Add new advanced modes
– HD-KFM: No lift, much higher sensitivity & resolution
– ResiScope & Soft ResiScope: Resistance & current, from 10² to 1012 ohms, also on soft samples
– Soft Intermittent contact mode: Adhesion, Stiffness, youngs modulus, constant force = quantitative measurement
Specifications
| XY Drive Resolution | 24-bit control - 0.06 Å |
| Z Drive Resolution | 24-bit control – 0.006 Å |
| Ultra-Low Noise HV | Typ: <0.01 mV RMS |
| 6 DAC Outputs | 6 D/A Converters – 24 bit (XYZ drive, bias, aux…) |
| 8 ADC Inputs | 8 A/D Converters – 16 bit |
| Data Points | Up to 8192 |
| Integrated Lock-in | Up to 6 MHz (software limited), 2nd lock-in (6 MHz-optional) |
| Interface | USB 2.0 |
| Power | AC 100 – 240 V - 47-63 Hz |
| OS Compatibility | Windows 10, 11 |
Industries
- Materials Science
- Life Sciences
- Semiconductors and Electronics
- Academics
- Others (includes solar cells, geoscience, forensic science, and food technology)
Applications
Materials Science
The Nano-Observer AFM series is tailored for materials science applications, delivering precise nanoscale analysis of surface morphology, mechanical properties, and electrical behaviour. Equipped with advanced techniques such as ResiScope and HD-KFM III, it supports the investigation of a wide range of materials, from nanocomposites to functional coatings. Ideal for both research and industrial development, it ensures reliable, high-resolution results to drive innovation in materials engineering.
Polymers
The Nano-Observer AFM series delivers high-precision polymer analysis, revealing surface morphology, mechanical properties, and electrical characteristics at the nanoscale. With advanced techniques like Soft ResiScope and HD-KFM, it supports applications from polymer development to quality control, ensuring reliable, high-resolution results for research and industry.
Semiconductors
The Nano-Observer AFM series is a powerful tool for semiconductor research, offering unparalleled precision in surface morphology, electrical characterisation, and mechanical property analysis at the nanoscale. Utilising cutting-edge techniques such as HD-KFM III and ResiScope, it enables detailed studies of semiconductor materials, from advanced device fabrication to quality assurance. Designed for both research and industrial applications, it ensures accurate, high-resolution data to drive innovation in semiconductor technology.
2D Materials
The Nano-Observer AFM series is a cutting-edge solution for the analysis of 2D materials like graphene, hBN, and transition metal dichalcogenides. It offers unparalleled precision in characterising surface morphology, mechanical properties, and electrical behaviour at the nanoscale. With advanced modes such as HD-KFM III and ResiScope, it enables detailed investigations of these materials' unique properties, supporting both fundamental research and industrial development in nanotechnology and advanced material applications.
Biology
The Nano-Observer AFM series provides exceptional capabilities for analysing biological samples, offering nanoscale insights into surface morphology, mechanical properties, and molecular interactions. With advanced techniques like Soft ResiScope and liquid imaging modes, it ensures precise characterisation of delicate biological structures, from cells to biomolecules. Designed for both research and applied science, it delivers reliable, high-resolution data essential for breakthroughs in biotechnology and life sciences.
Energy Materials
The Nano-Observer AFM series excels in the analysis of renewable energy materials, offering high-precision characterisation of surface morphology, electrical properties, and mechanical behaviour at the nanoscale. With advanced techniques like HD-KFM III and ResiScope, it is ideal for studying photovoltaics, battery materials, and energy storage systems. Supporting both research and industrial applications, it provides reliable, high-resolution data to accelerate innovation in sustainable energy technologies.
Videos
Atomic Force Microscope Galaxy Dual Controller
Downloads
Galaxy Dual Controller Brochure
Characterisation of Solid-State Polymer Batteries
Photovoltaic Materials Characterisation
Characterisation of 2D Materials With Advanced AFM Techniques
Related Products
Service Support
Comprehensive repairs and servicing
Annual Support Programs
Your metrology instrumentation is a major investment that is critical to your business operation and success. In today’s competitive climate, it is more important than ever to extend the functionality and peak performance of your metrology equipment years beyond the expiration of your factory warranty. CN Tech’s Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.
With over 20 years’ experience servicing and repairing you can be assured that your system is in safe hands. The independent services we offer include system relocation, maintenance visits, parts and consumables, and break down interventions.
CN Tech’s Support Programs are an economical way to guarantee optimal working condition:
- Annual Preventive Maintenance
- Priority Technical Assistance
- Preferred Parts Availability
- On-Site User Training
- Remote Diagnostics
- No surprise repair expense and much more!
Support Contact Example
An example of our service and support contracts are shown below:
Metrology & Instrumentation Annual Support Programs 2024/25
CN Tech's Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.