Evactron® TEM Wand™
The Evactron® TEM Wand™ brings gentle downstream plasma cleaning right to the polepiece — clearing hydrocarbon contamination inside the TEM column, with no liquid-nitrogen cold trap and no damage to sensitive components.
Key Features
- Fits Standard Side-Entry Goniometers: Built to standard TEM/STEM side-entry goniometer dimensions – inserts like any specimen holder
- POP Ignition at vacuum: POP Ignition strikes the plasma reliably every time without venting the column
- Air-fed oxygen radicals: Uses ambient air to generate reactive oxygen plasma radicals — no special process-gas supply needed
- Damage-free polepiece cleaning: Safely de-contaminates the polepiece area without damaging sensitive components
- No spot or scan artifacts: Eliminates spot-mode and scanning-mode contamination artefacts from your images and analysis
- No LN₂ cold trap: Removes the need for a liquid-nitrogen cold trap — a simpler workflow with less upkeep
Manufacturer
Evactron Plasma Cleaning by XEI Scientific
For almost three decades XEI Scientific has helped researchers, engineers, and manufacturers to maintain cleaner vacuum environments for electron microscopy and advanced analytical instrumentation.
XEI Scientific pioneered downstream plasma cleaning for electron microscopes and introduced the Evactron® De-Contaminator, the first commercial in-situ plasma cleaning system for electron microscope vacuum chambers. Today, Evactron plasma cleaning technology is trusted by laboratories worldwide to remove hydrocarbon contamination, support pristine vacuum conditions, and improve performance across SEM, TEM, FIB, UHV, EUV, X-ray optics, and specimen-preparation applications.
Their mission is straightforward: to help scientists and engineers achieve cleaner systems, clearer data, and more dependable results. As XEI Scientific enters its next chapter, we remain committed to practical innovation, responsive customer support, and the high standards of quality and reliability that have defined the Evactron name.
How It Works
The Wand reaches into the column and delivers oxygen plasma radicals to the objective-lens polepiece — the region where beam-induced hydrocarbon contamination collects.
The Evidence
Contamination Removed. Imaging Restored.
Before: hydrocarbon contamination spots build up under the beam.
After: no contamination build up under focused e- beam when cleaned by TEM Wand.
Videos
Evactron® TEM Wand™ - Cleaning right where contamination forms
Related Products
Service Support
Comprehensive repairs and servicing
Annual Support Programs
Your metrology instrumentation is a major investment that is critical to your business operation and success. In today’s competitive climate, it is more important than ever to extend the functionality and peak performance of your metrology equipment years beyond the expiration of your factory warranty. CN Tech’s Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.
With over 20 years’ experience servicing and repairing you can be assured that your system is in safe hands. The independent services we offer include system relocation, maintenance visits, parts and consumables, and break down interventions.
CN Tech’s Support Programs are an economical way to guarantee optimal working condition:
- Annual Preventive Maintenance
- Priority Technical Assistance
- Preferred Parts Availability
- On-Site User Training
- Remote Diagnostics
- No surprise repair expense and much more!
Support Contact Example
An example of our service and support contracts are shown below:
Metrology & Instrumentation Annual Support Programs 2024/25
CN Tech's Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.