Electric Force Microscopy
Electric Force Microscopy (EFM) is an advanced Atomic Force Microscopy (AFM) technique that allows for high-resolution mapping of electric field gradients at the nanoscale. This powerful mode is crucial for studying a wide range of materials and devices, offering unprecedented insights into their electrical properties and behaviour.
Manufacturer
CSI
CSInstruments is a French scientific equipment manufacturer specialised in the conception of Atomic Force Microscope and options designed for existing AFM (Nano-Observer AFM, Resiscope™, High Voltage Amplifier, Magnetic modules). The product range proposed by CSInstruments is designed and manufactured to help the scientific community to achieve nanometre performances that meet the research needs and requirements for actual and future nanoscience applications.
CSInstruments was founded by a team of experts working in AFM field for more than 20 years, starting as pioneer with some historical manufacturers. CSInstruments activity is also based on a qualified and dynamic team, experienced in the fields of mechanics, electronics and data processing. This expertise ensures innovation and performance in the production of AFM and achieves an excellent price/performance ratio!
Key Features
- High Sensitivity: Detect even the smallest variations in electric field gradients
- Excellent Spatial Resolution: Achieve lateral resolution down to a few nanometres
- Non-Destructive Imaging: Ideal for delicate or sensitive samples
- Quantitative Measurements: Map relative strengths of electric fields across surfaces
- Integration with Other Modes: Combine EFM with topography, mechanical, or other electrical modes for comprehensive analysis
- User-Friendly Interface: Intuitive software makes EFM accessible to both experts and beginners
How does EFM work?
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Topography Scan: A metal-coated tip first scans the surface to record topography.
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Lift Mode: The tip is then raised to a specific height above the sample.
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Electric Field Detection: As the tip moves across the surface, it detects the gradient of electrical forces present.
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Data Recording: The system records the phase shifts of the cantilever oscillation, which correspond to the electric field gradient.
This two-pass technique allows for separate optimisation of topographical and electrical measurements, ensuring high-quality data for both.
Specifications
| Lift Height Range | 5 nm - 100 nm (typical) |
| Lateral Resolution | < 20 nm (tip-dependent) |
| Optional | Advanced EFM modules for quantitative measurements |
| Compatible with all CSInstruments AFM systems |
Industries
- Materials Science
- Life Sciences
- Semiconductors and Electronics
- Academics
- Others (includes solar cells, geoscience, forensic science, and food technology)
Applications
Materials science
- Characterisation of dielectric thin films
- Study of charge distribution in composite materials
- Investigation of ferroelectric domain structures
Electronic Materials
- Failure analysis in microelectronic devices
- Detection and mapping of trapped charges
- Characterisation of semiconductor dopant distributions
Life Sciences
- Study of charge distributions in biological membranes
- Investigation of electrical properties of biomaterials
Polymer Science
- Analysis of charge accumulation and dissipation in polymers
- Characterisation of piezoelectric polymers
Nanotechnology
- Electrical characterisation of nanomaterials (e.g., carbon nanotubes, graphene)
- Development and optimisation of nanoelectronic devices
Related Products
Service Support
Comprehensive repairs and servicing
Annual Support Programs
Your metrology instrumentation is a major investment that is critical to your business operation and success. In today’s competitive climate, it is more important than ever to extend the functionality and peak performance of your metrology equipment years beyond the expiration of your factory warranty. CN Tech’s Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.
With over 20 years’ experience servicing and repairing you can be assured that your system is in safe hands. The independent services we offer include system relocation, maintenance visits, parts and consumables, and break down interventions.
CN Tech’s Support Programs are an economical way to guarantee optimal working condition:
- Annual Preventive Maintenance
- Priority Technical Assistance
- Preferred Parts Availability
- On-Site User Training
- Remote Diagnostics
- No surprise repair expense and much more!
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Metrology & Instrumentation Annual Support Programs 2024/25
CN Tech's Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.