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Probe-Surface Interaction: A sharp tip attached to a cantilever is brought into direct contact with the sample surface.
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Constant Force: As the tip scans across the surface, a feedback loop maintains a constant cantilever deflection, ensuring consistent contact force.
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Laser Detection: A laser beam reflected off the cantilever's back detects minute changes in its deflection.
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Topography Mapping: Vertical movements of the piezoelectric scanner, adjusted to maintain constant deflection, are recorded to create a topographical map.
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Friction Measurement: Torsional movements of the cantilever provide information about surface friction (Lateral Force Microscopy - LFM).
Contact / Friction
Contact / Friction Mode is one of the foundational techniques in Atomic Force Microscopy (AFM), offering high-resolution imaging and force measurement capabilities. In this mode, a nanometric probe maintains constant contact with the sample surface, providing direct topographical information and friction data.
Manufacturer
CSI
CSInstruments is a French scientific equipment manufacturer specialised in the conception of Atomic Force Microscope and options designed for existing AFM (Nano-Observer AFM, Resiscope™, High Voltage Amplifier, Magnetic modules). The product range proposed by CSInstruments is designed and manufactured to help the scientific community to achieve nanometre performances that meet the research needs and requirements for actual and future nanoscience applications.
CSInstruments was founded by a team of experts working in AFM field for more than 20 years, starting as pioneer with some historical manufacturers. CSInstruments activity is also based on a qualified and dynamic team, experienced in the fields of mechanics, electronics and data processing. This expertise ensures innovation and performance in the production of AFM and achieves an excellent price/performance ratio!
Key Features
- High Resolution: Achieve atomic-scale imaging on suitable samples
- Direct Force Measurement: Quantitative analysis of tip-sample interactions
- Versatility: Compatible with various sample types and environments
- Simultaneous Data Acquisition: Collect topography and friction data in a single scan
- Established Technique: Well-understood methodology with extensive literature support
How does Contact Mode AFM work?
Applications
Materials Science
Electronic Materials
Life Science
Nanostructure
Polymer
Related Products
Service Support
Comprehensive repairs and servicing
Annual Support Programs
Your metrology instrumentation is a major investment that is critical to your business operation and success. In today’s competitive climate, it is more important than ever to extend the functionality and peak performance of your metrology equipment years beyond the expiration of your factory warranty. CN Tech’s Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.
With over 20 years’ experience servicing and repairing you can be assured that your system is in safe hands. The independent services we offer include system relocation, maintenance visits, parts and consumables, and break down interventions.
CN Tech’s Support Programs are an economical way to guarantee optimal working condition:
- Annual Preventive Maintenance
- Priority Technical Assistance
- Preferred Parts Availability
- On-Site User Training
- Remote Diagnostics
- No surprise repair expense and much more!
Support Contact Example
An example of our service and support contracts are shown below:
Brochures
Metrology & Instrumentation Annual Support Programs 2024/25
CN Tech's Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.