The CN Tech team is at EBSD 2019 today, at NPL in London. At this annual meeting, the latest advances in Electron Backscatter Diffraction (EBSD) techniques and applications will be discussed. A range of talks are being held, discussing the latest research in the microstructural analysis of materials. A workshop on EBSD data analysis is also being, as well as a commercial exhibition. More information can be found at the RMS website, including the full programme and delegate information.
CN Tech are exhibiting a variety of microscopy and materials analysis solutions, including the Swift Instruments in-situ tensile stage range. This innovative range of tensile testers have been designed especially for EBSD applications. To find out more, explore the Miniature Tensile Test category of our website. We will also be on hand to discuss our electron microscopy solutions from COXEM, and nanoindentation systems from KLA.
We hope to see you there!