Scanning Electron Microscopes
EM-30 Plus & LE Desktop SEM
The COXEM EM-30 benchtop Scanning Electron Microscope offers advanced, high-end features in a compact form factor. This benchtop SEM features high resolution imaging and dual SE and BSE detectors. A 3-axis motorised stage is included as standard for efficient and simple operation.
EM-30AX Plus & LE Desktop SEM with EDS
The COXEM EM-30AX Desktop Scanning Electron Microscope offers advanced, high-end features in a compact form factor. This desktop SEM features high resolution imaging and dual SE and BSE detectors. A 3-axis motorised stage is included as standard. The EM-30AX has integrated EDS for elemental microanalysis.
CX-200 Plus Scanning Electron Microscope
The COXEM CX-200 Plus SEM provides high performance in a compact size, at an attractive price. This full size SEM features high resolution imaging, and SE and BSE detectors. With a 5-axis motorised stage and chamber view camera as standard, the CX-200 Plus is easy to use. Analytical options include EDS, EBSD and CL detectors.
CP-8000 Ion Mill Cross Section Polisher
The CP-8000 Ion Mill Cross Section Polisher gives a perfect finish for SEM sample preparation. Using an argon ion beam, the CP-8000 gently removes material from a sample's surface without deforming or smearing.
SPT-20 Ion Sputter Coater
The SPT-20 Ion Sputter Coater is a simple to use, compact and cost-effective solution for sputter coating non-conductive specimens in SEM sample preparation. Features a user friendly touch screen interface, and supports multiple metal types.
COXEM Options & Accessories
A range of options and accessories are available for COXEM scanning electron microscope systems, to enhance their capabilities and applications. As effective sample preparation is vital for good imaging, COXEM also provides a selection of specimen preparation equipment.
Oxford Instruments Upgrades
Oxford Instruments have developed a range or reliable, accurate and straightforward solutions for SEM materials characterisation. Powerful and simple to use, the EDS, EBSD and WDS systems from Oxford Instruments provide ideal upgrade possibilities for in-situ materials analysis.