Sheet Resistance Measurement

4-Point Probes

In the world of semiconductors, electrical measurement systems are crucial for measuring and monitoring sheet resistance and resistivity of thin films and bulk materials. FilmetricsĀ® specialises in providing benchtop metrology instruments, including sheet resistance mapping systems (4-point probe and eddy current). The 4-point probes have a variety of pin tip options, including different radii and spacing, to be used for various applications like metal measurements, implantation measurements or high impedance surface measurement. They provide a reliable and accurate way of measuring the sheet resistance of thin films and semiconductors.

4PP-TypeA

4PP-TypeA

4PP-TypeB

4PP-TypeB

4PP-TypeC

4PP-TypeC

4PP-TypeD

4PP-TypeD

4PP-TypeE

4PP-TypeE

4PP-TypeF

4PP-TypeF

4PP-TypeG

4PP-TypeG

4PP-TypeH

4PP-TypeH

4PP-TypeI

4PP-TypeI

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