Park XE7 AFM

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Short Description
  • The most affordable research grade AFM with flexible sample handling

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Product Overview
  • The economical choice for innovative research

    Park XE7 has all the state-of-the-art technology you've come to expect from Park Systems, at a price your lab can afford. Designed with the same attention to detail as our more advanced models, the XE7 allows you to do your research on time and within budget.

    Uncompromised High Performance

    Park XE7 provides accurate measurement at highest nanoscale resolution than any other products in its class.It allows you to obtain sample images and its characteristic measurements true to its nano structure thanks to its flat, orthogonal, and linear scan measurements by its unique AFM architecture: independent XY and Z, flexure based scans. Furthermore, Park's unique True Non-Contact mode provides you with the sharpest images, scan after scan without declining resolution.

    For Current and Future Needs

    Park XE7 empowers you to innovate now and in the future. It gives you ready access to the largest number of measurement modes in the industry. You can employ any of these modes now, and in the future to support your evolving needs. What's more, the XE7 has the most open access design in the market that allows you to integrate and combine accessories and instruments to tailor it to your unique research requirements.

    Easy to Use and High Productivity

    Park XE7 together with its intuitive graphical user interface, and its automated tools, allows even novice users get from sample placement to scan results, fast. Starting from pre-aligned tip mount, easy sample and tip exchange, simple laser alignment, on-axis top-down optical viewing, to user friendly scan controls and software processing, the XE7 provides highest research productivity in AFM.

    Economical Beyond the System Cost

    Not only is Park XE7 the most affordable as a research grade AFM, it is also the most economical in total cost of ownership. Park's True Non-Contact mode technology found in the XE7 allows users to save money on costly probe tips. Moreover, Park XE7 offers you much longer product life and upgradeability as a result of its compatibility with the most extensive types of modes and options available in the industry.

  • XY Scanner Single-module flexure XY scanner with closed-loop control
    Scan range 100µm x 100µm
    50µm x 50µm
    10µm x 10µm
    Manual Stage XY travel range : 13 x 13 mm
    Z travel range : 29.5 mm
    Focus travel range : 70 mm
    Z Scanner range Guided high-force Z scanner
    Scan range 12 µm
    15 µm
    Sample Mount Sample size : Up to 100 mm
    Thickness : Up to 20 mm
    Vision Direct on-axis vision of sample surface and cantilever
    Coupled with 10x objective lens (20x optional)
    Field-of-view : 480 x 360 µm
    CCD : 1 Mpixel
    Software XEP Dedicated system control and data acquisition software
    Adjusting feedback parameters in real time
    Script-level control through external programs(optional)
    XEI AFM data analysis software
    Electronics High performance DSP : 600 MHz with 4800 MIPS
    Maximum 16 data images
    Maximum data size : 4096 x 4096 pixels
    Signal inputs : 20 channels of 16 bit ADC at 500 kHz samplings
    Signal outputs : 21 channels of 16 bit DAC at 500 kHz settling
    Synchronous signal : End-of-image, end-of-line, and end-of-pixel TTL signals
    Active Q control (optional)
    Cantilever spring constant calibration (optional)
    CE Compliant
    Power : 120 W
    Signal Access Module (Optional)

    AFM Modes

    Standard Modes

    • True Non-Contact AFM
    • Basic Contact AFM
    • Lateral Force Microscopy (LFM)
    • Phase Imaging
    • Intermittent (tapping) AFM

    Optional Modes

    Dielectric/Piezoelectric Properties

    • Electric Force Microscopy (EFM)
    • Dynamic Contact EFM (EFM-DC)
    • Piezoelectric Force Microscopy (PFM)
    • PFM with High Voltage

    Magnetic Properties

    • Magnetic Force Microscopy (MFM)
    • Tunable MFM

    Electrical Properties

    • Conductive AFM
    • IV Spectroscopy
    • Scanning Kelvin Probe Microscopy (SKPM/KPM)
    • SKPM with High Voltage
    • Scanning Capacitance Microscopy (SCM)
    • Scanning Spreading-Resistance Microscopy (SSRM)
    • Scanning Tunneling Microscopy (STM)
    • Time-Resolved Photo Current Mapping (PCM)

    Chemical Properties

    • Chemical Force Microscopy with Functionalized Tip
    • Electrochemical Microscopy (EC-STM and EC-AFM)

    Force Measurement

  • Force Distance (FD) Spectroscopy
  • Force Volume Imaging
  • Mechanical Properties

    • Force Modulation Microscopy (FMM)
    • Nanoindentation
    • Nanolithography
    • Nanolithography with High Voltage
    • Nanomanipulation
    • Piezoelectric Force Microscopy (PFM)

    Optical Properties

    • Tip-Enhanced Raman Spectroscopy (TERS)
    • Time-Resolved Photo Current Mapping (PCM)

    Park XE7 AFM Options

    25 µm Z-scanner Head

    Z scan range 25 µm
    Resonant frequency 1.7 kHz
    Laser type LD (650 nm)
    SLD (830 nm)
    Noise floor 0.03 nm (typical)
    0.05 nm (maximum)

    XE Optical Head

    Optical access top and side
    Z scan range 12 µm or 25 µm
    Laser type LD (650 nm)
    SLD (830 nm)
    Noise floor 0.03 nm (typical)
    0.05 nm (maximum)
    Resonant frequency 3 kHz (12 µm XE Head)
    1.7 kHz (25 µm XE Head)

    Magnetic Field Generator

    • Applies external magnetic field parallel to sample surface
    • Tunable magnetic field
    • Range : -300 to +300 gauss, -1500 to +1500 gauss
    • Composed of pure iron core & two solenoid coils

    Clip-type Probehand

    • Can be used with an unmounted cantilever
    • Tip bias function available for EFM and Conductive AFM
    • Tip bias range : -10 V to +10 V
    • Support all the standard and advanced modes but STM, SCM, and in-liquid imaging

    Liquid Cell

    • Universal liquid cell
      • Open or closed liquid cell with liquid/gas perfusion
      • Temperature control range : 4 °C to +110 °C (in air), 4 °C to +70 °C (with liquid)
    • Open/closed liquid cell
    • Electrochemistry cell

    Liquid Probehand

    • Designed for imaging in general liquid environment
    • Resistant to most buffer solutions including acid
    • Contact and Non-contact AFM imaging in liquid

    Temperature Control Stages

    • Type 1 : 0 °C to +180 °C
    • Type 2 : Ambient to +250 °C
    • Type 3 : Ambient to +600 °C

    Signal Access Module (SAM)

    • Enables access to various input/output signals for AFM
    • Scanner driving signal for the XY and Z scanners
    • Position signal for the XY and Z scanners
    • Cantilever deflection signals of the vertical/lateral direction
    • Bias signal for the sample and the cantilever
    • Driving signal for XE7
    • Auxiliary input signal to the system
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