Park NX10 AFM

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Short Description
  • The premiere choice for nanotechnology research

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Product Brochure
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Product Overview
  • Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. From sample setting to full scan imaging, measurement, and analysis, Park NX10 saves you time every step of the way. With more time and better data, you can focus on doing more innovative research.

    Better data

    Park NX10 produces data you can trust, replicate, and publish at the highest nano resolution. It features the world's only true non-contact AFM that prolongs tip life while preserving your sample, and flexure based independent XY and Z scanner for unparalleled accuracy and resolution.

    Better productivity

    Powered by our revolutionary operating software Park SmartScan, Park NX10 is capable of quicker, easier setup and more optimal data collection than ever before. Park SmartScan's auto mode allows novices to quickly collect high quality nanoscale images with just three clicks of a mouse while its manual mode provides all of the functionality necessary for veterans to customize their workflow as needed.

    Better research

    With more time and better data, you can focus on doing more innovative research. And the Park NX10's wide range of measurement modes and customizable design means it can be easily tailored to the most unique projects.

Specification
  • Z Scanner Guided high-force flexure scanner
    Scan range : 15 µm (optional 30 µm)
    Resolution : 0.015 nm
    Position detector noise : 0.03 nm (bandwidth: 1 kHz)
    Resonant frequency : > 9 kHz (typically 10.5 kHz)
    XY Scanner Single module flexure XY-scanner with closed-loop control
    50 µm x 50 µm (optional 10 µm x 10 µm or 100 µm x 100 µm)
    Resolution : 0.05 nm
    Position detector noise : < 0.25 nm (bandwidth: 1 kHz)
    Out-of-plane motion : < 2 nm (over 40 µm scan)
    Stage Z stage range : 25 mm
    Focus travel range : 15 mm
    XY stage travel range : 20 mm x 20 mm
    Sample size : Open space up to 100 mm x 100 mm, thickness up to 20 mm
    Sample weight : < 500 g
    Vision 10x (0.21NA) ultra-long working distance lens (1µm resolution)
    20x (0.42 NA) high-resolution, long working distance lens (0.6 µm resolution)
    Direct on-axis vision of sample surface and cantilever
    Field-of-view : 480 x 360 µm (with 10x objective lens)
    CCD : 1 Mpixel, 5 Mpixel(optional)
    Software SmartScan Dedicated system control and data acquisition software
    Adjusting feedback parameters in real time
    Script-level control through external programs(optional)
    XEI AFM data analysis software
    Electronics Signal processing ADC 18 channels
    4 high-speed ADC channels
    24-bit ADCs for X, Y, and Z scanner position sensor
    DAC 12 channels
    2 high-speed DAC channels
    20-bit DACs for X, Y, and Z scanner positioning
    Maximum data size 4096 x 4096 pixels
    Integrated functions 3 channels of flexible digital lock-in amplifier
    Spring constant calibration (Thermal method, optional)
    Digital Q control
    External signal access 20 embedded signal input/output ports
    5 TTL outputs : EOF, EOL, EOP, Modulation, and AC bias
Product Brochure

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