The UNECS range of spectroscopic ellipsometers from ULVAC can measure the refractive index and thickness of thin films quickly and accurately ULVAC have developed a unique and innovative snapshot measurement method, that provides ultra-fast measurements and reliable, compact systems. A range of portable and full size, automatic systems are available.
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UNECS Portable High-speed Spectroscopic EllipsometerWith a compact size, low weight and ULVAC's ultra-fast measurement technology, the UNECS-Portable can be easily transported for quality assurance and acceptance testing applications. The ellipsometer's stage can be detached for measuring directly on large samples.
UNECS Automatic High-speed Spectroscopic EllipsometerAn automatic stage and auto focus system allow the UNECS Automatic range to provide film thickness mapping of a samples entire surface. Maps can be generated in both 2D and 3D with colour thickness maps. A range of 3 models support 150, 200 and 300mm diameter samples.