AFM for SEM - Nano Analytik

The AFM in SEM from the nano analytik GmbH is not only used for imaging, it is capable to be employed for metrology as well. For this purpose, we are offering a compact-AFM system, applicable in any SEM without chamber modification, for micro manipulation and metrology scanning.

Top products in this category

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    AFM in SEM
    A compact AFM system, applicable in any SEM without chamber modification, for micro manipulation and metrology scanning
1 Item(s)

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