Thermal measurements AFM

Thermal analysis: Tm & Tg measurements & SThM: Thermal conductivity & temperature measurements

Manufacturer

CSI

CSInstruments is a French scientific equipment manufacturer specialised in the conception of Atomic Force Microscope and options designed for existing AFM (Nano-Observer AFM, Resiscope™, High Voltage Amplifier, Magnetic modules). The product range proposed by CSInstruments is designed and manufactured to help the scientific community to achieve nanometer performances that meet the research needs and requirements for actual and future nanoscience applications.

CSInstruments was founded by a team of experts working in AFM field for more than 20 years, starting as pioneer with some historical manufacturers. CSInstruments activity is also based on a qualified and dynamic team, experienced in the fields of mechanics, electronics and data processing. This expertise ensures innovation and performance in the production of AFM and achieves an excellent price/performance ratio!

Key Features

  • Thermal analysis: Tm & Tg measurements
  • SThM: Thermal conductivity & temperature measurements
  • Temperature measurements up to 700 °C
  • Thermal conductivity mapping

Thermal measurements AFM

Thermal analysis: Tm & Tg measurements
The probe mounted on a dedicated support is moved to the point selected and placed on the surface of the sample. Then the temperature of the tip is ramped linearly with time while the degree of bending is monitored. At the point of phase transition the material beneath the tip softens and the probe penetrates into the sample this provides the nanoscale equivalent of a bulk thermo-mechanical analysis experiment whereby you can measure the phase transition temperatures of the sample such as Tg or Tm.

SThM : Thermal conductivity & temperature measurements
The operation of a Scanning Thermal Microscope is based on Atomic Force Microscopy (AFM) Techniques.When the atomically sharp AFM tip is placed in proximity to a sample to be studied there is a heat exchange which modifies the temperature of the tip. It is then relatively straightforward to use signals from the tip to create what is effectively a thermal map of the surface.

Thermal analysis Benefits

  • Tg measurement
  • Tm measurement

SThM Benefits  

  • <50 nm thermal spatial resolution (up to 20 nm)  
  • 0.01 °C sensitivity  
  • Temperature measurements up to 700 °C  
  • Thermal conductivity mapping

Product range

Soft Intermittent Contact

Contact Mode

ResiScope Mode

Conductive AFM Mode

Force Modulation Mode

Piezoresponse Force Microscopy Mode

Oscillating Mode

Electric Force Microscopy Mode

Magnetic Force Microscopy Mode

VMFM – Variable Magnetic Field Module

Thermal Measurements AFM

Applications

  • Material science
  • Polymer

Industries

  • Materials Science
  • Life Sciences
  • Semiconductors and Electronics
  • Academics
  • Others (includes solar cells, geoscience, forensic science, and food technology)

 

If you would like to learn more about Thermal measurements AFM, contact our experienced technical team today. We would be happy to help you find the right profilometry solution for your needs. Contact us today!