Tencor™ P-17 Stylus Profiler

The P-17 offers step height measurement capability for steps from a few nanometers to one millimeter, for production and R&D environments. The system supports 2D and 3D measurements of step heights, roughness, bow and stress for scans up to 200mm without stitching. Excellent measurement stability is achieved with the combination of an UltraLite® sensor, constant force control and an ultra-flat scanning stage.



A global technology leader who make an impact by creating solutions that drive progress and transform industries. Collaboration is the key to their success. KLA provide leading-edge technology and devices using advanced inspection tools, metrology systems, and computational analytics. Their solutions accelerate tomorrow’s electronic devices. The enable evolution and innovation in the data era across key industries including automotive, mobile and data center.  


Key Features

  • Step Height Repeatability of 4Å on a 1μm step
  • Low force with constant force control: 0.03 to 50mg
  • Long Scan Over Full 200mm Stage without stitching
  • Auto Pattern Recognition & Sequencing
  • Advanced Apex 2D & 3D Surface Analysis Software
  • 3D Stress Capability
  • Constant Force Control Sensor
  • Video: 5MP high-resolution color camera
  • Arc correction: Removes error due to arc motion of the stylus
  • Software: Easy-to-use software interface
  • Production capability: Fully automated with sequencing, pattern recognition and SECS/GEM
  • Wafer handler: Automatically loads 75mm through 200mm opaque

Unrivalled Scan Length & Advanced Sample Stage

The KLA P-17 Stylus Profiler features a motorised stage capable of performing long scans up to 200mm in length, without the need for scan stitching. The full diameter of sample wafers can be measured in a single scan. The P-17 has the longest scan capability on the market today.

The P-17’s sample stage also has a variety of advanced enhancements, such as automatic stage levelling. Before scanning the P-17 will take measurements at the start and end of a scan, and automatically adjust the stage tilt to correct levelling and improve accuracy. The stage can be configured with a variety of sample chucks to support a wide range of applications.

High Measurement Repeatability

Building upon over 40 years of surface metrology development, KLA have designed the P-17 to utilise highly advanced measurement technology. Performing 2D and 3D measurements with the P-17 is fast and accurate. The P-17 features the UltraLite® sensor, with constant force control, high linearity and unmatched repeatability and reproducibility. With a step height repeatability of 4Å on a 1μm step, the P-17’s repeatability is the best in the industry.

The UltraLite® sensor also provides unprecedented detail in measurement, featuring the highest vertical resolution on the market. A wide 1mm Z range allows for greater flexibility in handling samples with large topography variations.

Comprehensive 2D & 3D Measurement Capabilities

The P-17 provides a comprehensive range of 2D and 3D measurement types, for both production and research applications. Step height can be measured with a vertical range from nanometres to 1000µm. With the UltraLite® sensor’s constant force control, measurement stability is ensured, and soft or delicate samples be measured accurately.

Measurement of texture, including roughness and waviness, and form, including bow and shape can also be measured. The P-17 is capable of measuring stress in both 2D and 3D. 2D stress measurement can be measured in a single scan across the diameter of a sample, utilising the P-17’s long 200mm scan length to avoid the need for stitching.

Shown left: 3D Surface Topography
Shown right: 3D Stress Mapping

Advanced Automation & Pattern Recognition

To make surface measurement as efficient as possible in production environments, KLA provide a comprehensive set of automation capabilities for the P-17. Automated defect review, sequencing, pattern recognition, and integration with SECS/GEM and HSMS are all possible on the P-17 platform.

The P-17’s pattern recognition capabilities utilise pre-taught patterns to automatically align a sample. This allows the P-17 to make fully automated measurements with enhanced stability, and reduces inaccuracies introduced by operator error. With the P-17’s defect review features, a wafer map can be loaded and specific areas can be inspected, and highlighted for further investigation. Automation recipes can be seamlessly moved between systems for maximum flexibility.

Product range

Alpha-Step® D-500
Alpha-Step® D-600
Tencor™ P-7
Tencor™ P-17 & P-17 OF
Tencor™ P-170


  • Step Height: 2D step height
  • Texture: 2D roughness and waviness
  • Form: 2D bow and shape
  • Stress: 2D thin film stress
  • Defect review: 2D and 3D defect surface topography


  • Universities, research labs and institutes
  • Semiconductor and compound semiconductor
  • LED: Light emitting diodes
  • Solar
  • MEMS: Micro-electro-mechanical systems
  • Data storage
  • Automotive
  • Medical devices

And more: Contact us with your requirements


Tencor P-17 OF

The Tencor P-17 OF (Open Frame) has the same capability as the Tencor P-17, but with a bigger frame to allow loading of larger samples. The system can be configured for 300mm wafers, or with a 240 x 240mm chuck.

Stylus Options

The Tencor P-17 has a variety of styli available to support the measurement of step heights, high aspect ratio steps, roughness, sample bow, and stress. The tip radius ranges from 40nm to 50µm and determines the lateral resolution of the measurement. The included angle ranges from 20 to 100 degrees, specifies the maximum aspect ratio of the measured feature. All styli are manufactured from diamond to reduce wear and increase stylus lifetime.

Sample Chucks

The Tencor P-17 has a range of chucks available to support application requirements. The standard is a universal vacuum chuck with precision locating pins for samples from 50 to 200mm. The universal chuck supports bow and stress measurements using 3-point locators to support the sample in a neutral position for accurate bow measurements. Additional options for solar samples, HDD disks, and precision sample location plates are available.

Isolation Tables

The Tencor P-17 has both tabletop and free-standing isolation table options. The Granite Isolator™ Series offers tabletop systems that combine granite with high grade silicone gel to provide passive isolation. The Onyz Series tabletop isolation systems use pneumatic air isolators to provide passive isolation. The TMC 63-500 Series isolation table is a free-standing steel frame table that uses pneumatic air isolators to provide passive isolation.

Step Height Standards

The Tencor P-17 uses thin and thick film NIST-traceable step height standards offered by VLSI Standards. The standards feature an oxide step on a silicon die mounted on a quartz block, or an etched quartz step with a chrome coating. A step height range of 8nm to 250µm is available.

Apex Analysis Software

Apex analysis software enhances the standard data analysis capability of the Tencor P-17 with an extended suite of leveling, filtering, step height, roughness, and surface topography analysis techniques. Apex supports ISO roughness calculation methods, plus local standards, such as ASME. Apex can also serve as a report writing platform with the capability to add text, annotations, and pass/fail criteria. Apex is offered in eight languages

Offline Analysis Software

The Tencor P-17 offline software has the same data analysis and recipe creation capability that exists on the tool. This enables the user to create recipes and analyze data without using valuable tool time.

Pattern Recognition

Pattern recognition uses pre-taught patterns to automatically align the sample. This enables fully automated measurements for enhanced measurement stability by reducing the impact of operator error. Pattern recognition combined with advanced calibrations reduces stage positioning error and enables seamless transfer of recipes between systems.


SECS/GEM and HSMS communications support factory automation systems and enable remote control of the Tencor P-17. Measurement results are automatically reported to host SPC systems, plus alarms and key calibration/configuration data. The Tencor P-17 is compliant with SEMI standards E4, E5, E30, and E37.


Tencor™ P-17 Stylus Profiler Brochure

Tencor™ P-17 Stylus Profiler Brochure

Benchtop Stylus Profilers Brochure

Benchtop Stylus Profilers Brochure

If you like to learn more about the KLA P-17 Stylus Profiler contact us today and discuss your measurement applications with our dedicated team of technical specialists. We would be happy to help you find the ideal profilometry solution. Contact us today!