Scanning Microwave Impedance Microscopy (sMIM)
Scanning Microwave Impedance Microscopy (sMIM) is a revolutionary AFM mode developed by PrimeNano and integrated with CSInstruments' Nano-Observer II. This cutting-edge technique offers high-quality images of local electrical properties with better than 50 nm resolution, utilising microwave reflections from a nanoscale region directly under the sMIM probe.
Manufacturer
CSI
CSInstruments is a French scientific equipment manufacturer specialised in the conception of Atomic Force Microscope and options designed for existing AFM (Nano-Observer AFM, Resiscope™, High Voltage Amplifier, Magnetic modules). The product range proposed by CSInstruments is designed and manufactured to help the scientific community to achieve nanometre performances that meet the research needs and requirements for actual and future nanoscience applications.
CSInstruments was founded by a team of experts working in AFM field for more than 20 years, starting as pioneer with some historical manufacturers. CSInstruments activity is also based on a qualified and dynamic team, experienced in the fields of mechanics, electronics and data processing. This expertise ensures innovation and performance in the production of AFM and achieves an excellent price/performance ratio!
Key Features
- Versatile Material Sensitivity: Accurately measure metals, semiconductors, insulators, and dielectrics
- Direct Measurement: Conductivity (σ) and permittivity (ε) measured directly at the nanoscale
- Linear Relationship: Ensures accurate data with a linear relationship to electrical properties
- Quantitative Mapping: Capable of quantitative doping concentration mapping
- Nano-Scale C-V Spectra: Offers detailed capacitance-voltage spectra at the nanoscale
- Sub-Surface Sensing: Image structures beneath the sample surface
How does sMIM work?
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Microwave Transmission: ScanWave™ sends microwaves to the probe tip via a fully shielded path
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Near-Field Interaction: Microwaves create a near-field electromagnetic wave at the probe tip, interacting with the sample surface and subsurface
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Signal Reflection: Reflected microwave power is processed by ScanWave™ electronics
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Image Creation: Local electrical property variations cause changes in reflected microwaves, creating calibrated capacitive and resistive images
Scanner Specifications
| XY Scan Range | 100 µm × 100 µm (±10%) |
| Z Range | 15 µm (±10%) |
| XY Resolution | < 0.1 nm |
| Z Resolution | < 0.05 nm |
Optical Detection System
| Laser Type | Low coherence laser diode |
| Detector | 4-quadrant photodiode |
| Laser Spot Size | < 30 µm |
Force Measurement
| Minimum Detectable Force | < 10 pN |
| Force Resolution | < 1 pN |
| Maximum Applied Force | Depends on cantilever (typically up to several µN) |
Imaging Modes
| Contact Mode |
| Lateral Force Microscopy (LFM) |
| Force-Distance Curves |
Feedback System
| Feedback Channels | Multiple (Deflection, Height, Friction) |
| Feedback Loop Rate | Up to 5 kHz |
Sample Stage
| Sample Size | Up to 50 mm diameter |
| Sample Weight | Up to 100 g |
| Motorised Sample Approach | 5 mm range, 1 µm resolution |
Environmental Control
| Temperature Range | Room temperature to 250°C (with optional heating stage) |
| Humidity Control | Optional |
| Liquid Cell | Available for imaging in fluid environments |
Data Acquisition
| ADC Resolution | 24-bit |
| Maximum Data Points per Line | 8192 |
| Maximum Data Acquisition Rate | 5 MHz |
Software Features
| Real-time data processing and display |
| Multiple channel data acquisition |
| Force curve analysis tools |
| Friction force calibration |
Compatibility
| Conductive AFM Mode |
| Force Modulation Mode |
| PiezoResponse Force Microscopy (PFM) |
Applications
Materials Science
The Nano-Observer AFM series is tailored for materials science applications, delivering precise nanoscale analysis of surface morphology, mechanical properties, and electrical behaviour. Equipped with advanced techniques such as ResiScope and HD-KFM III, it supports the investigation of a wide range of materials, from nanocomposites to functional coatings. Ideal for both research and industrial development, it ensures reliable, high-resolution results to drive innovation in materials engineering.
Semiconductors
The Nano-Observer AFM series is a powerful tool for semiconductor research, offering unparalleled precision in surface morphology, electrical characterisation, and mechanical property analysis at the nanoscale. Utilising cutting-edge techniques such as HD-KFM III and ResiScope, it enables detailed studies of semiconductor materials, from advanced device fabrication to quality assurance. Designed for both research and industrial applications, it ensures accurate, high-resolution data to drive innovation in semiconductor technology.
Biology
The Nano-Observer AFM series provides exceptional capabilities for analysing biological samples, offering nanoscale insights into surface morphology, mechanical properties, and molecular interactions. With advanced techniques like Soft ResiScope and liquid imaging modes, it ensures precise characterisation of delicate biological structures, from cells to biomolecules. Designed for both research and applied science, it delivers reliable, high-resolution data essential for breakthroughs in biotechnology and life sciences.
Polymers
The Nano-Observer AFM series delivers high-precision polymer analysis, revealing surface morphology, mechanical properties, and electrical characteristics at the nanoscale. With advanced techniques like Soft ResiScope and HD-KFM, it supports applications from polymer development to quality control, ensuring reliable, high-resolution results for research and industry.
2D Materials
The Nano-Observer AFM series is a cutting-edge solution for the analysis of 2D materials like graphene, hBN, and transition metal dichalcogenides. It offers unparalleled precision in characterising surface morphology, mechanical properties, and electrical behaviour at the nanoscale. With advanced modes such as HD-KFM III and ResiScope, it enables detailed investigations of these materials' unique properties, supporting both fundamental research and industrial development in nanotechnology and advanced material applications.
Energy Materials
The Nano-Observer AFM series excels in the analysis of renewable energy materials, offering high-precision characterisation of surface morphology, electrical properties, and mechanical behaviour at the nanoscale. With advanced techniques like HD-KFM III and ResiScope, it is ideal for studying photovoltaics, battery materials, and energy storage systems. Supporting both research and industrial applications, it provides reliable, high-resolution data to accelerate innovation in sustainable energy technologies.
Related Products
Service Support
Comprehensive repairs and servicing
Annual Support Programs
Your metrology instrumentation is a major investment that is critical to your business operation and success. In today’s competitive climate, it is more important than ever to extend the functionality and peak performance of your metrology equipment years beyond the expiration of your factory warranty. CN Tech’s Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.
With over 20 years’ experience servicing and repairing you can be assured that your system is in safe hands. The independent services we offer include system relocation, maintenance visits, parts and consumables, and break down interventions.
CN Tech’s Support Programs are an economical way to guarantee optimal working condition:
- Annual Preventive Maintenance
- Priority Technical Assistance
- Preferred Parts Availability
- On-Site User Training
- Remote Diagnostics
- No surprise repair expense and much more!
Support Contact Example
An example of our service and support contracts are shown below:
Metrology & Instrumentation Annual Support Programs 2024/25
CN Tech's Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.