ResiScope

The ResiScope II is a unique system capable of measuring AFM resistance over 10 decades with a high sensitivity and resolution. It can be combined with several dynamic modes as MFM/EFM (AC/MAC mode) or KFM single‐pass (AC/MAC III) providing several sample characterisation on the same scan area.

Manufacturer

CSI

CSInstruments is a French scientific equipment manufacturer specialised in the conception of Atomic Force Microscope and options designed for existing AFM (Nano-Observer AFM, Resiscope™, High Voltage Amplifier, Magnetic modules). The product range proposed by CSInstruments is designed and manufactured to help the scientific community to achieve nanometre performances that meet the research needs and requirements for actual and future nanoscience applications.

CSInstruments was founded by a team of experts working in AFM field for more than 20 years, starting as pioneer with some historical manufacturers. CSInstruments activity is also based on a qualified and dynamic team, experienced in the fields of mechanics, electronics and data processing. This expertise ensures innovation and performance in the production of AFM and achieves an excellent price/performance ratio!

Product Videos

Key Features

  • Dual measurement system
  • Easy to use intuitive software
  • High sensitivity and resolution
  • Measure AFM resistance over 10 decades
  • Can be combined with several dynamic modes

A dual measurement system

  • Resistance Measurement
  • Current measurement (& IV spectroscopy)
  • Compatible with Oscillating mode (Tapping / AC mode )
  • Compatible with EFM/MFM or Single-pass KFM
  • Resistance 102 ohms to 1012 ohms (10 decades dynamic)
  • Output information : R, Log R, Current & I/V Spectroscopy

Intuitive software

  • Easy to use
  • Automatic mode selection
  • Configurable outputs
  • Selectable output scale : R | Log R | Current

Principle

During the measurement, the DSP chooses in real time the best gain to optimize the measurement made by the amplifier module (HPA). This operating condition allows a very high sensitivity on all the range of resistivity at a regular scan speed (AFM) . Contrary to other techniques, the current between the probe and the sample is strongly reduced. This has the result of limiting the local effect of oxidation or electrochemistry and protecting the conductive probe from high current damage.

Image: ResiScope is a smart real-time control of the appropriate ranges to obtain the best measurement (sensitivity and range). It limits the current through tip and sample is limited to prevent any damage. It is more than a simple linear or Log amplifier used for a basic current measurement

Awards

2014: Yves Rocard 2014 Prize (Société Française de physique)

Yves Rocard 2014 prize has been presented by Francis Rocard, astrophysicist who participated in the VEGA Mission (overflight Halley’s comet).

This prize has awarded the « ResiScope™ II for its instrumental innovation and the successful of technology transfer between an academic laboratory and a private company.

Based on the work of the thesis of Olivier Schneegans, in collaboration with the LGEP (Laboratory of Electrical Engineering of Paris), ScienTec – CSInstruments have developed an electrical characterization system with wide dynamic range in AFM (Atomic Force Microscopy).

 

FIEEC Prize for Applied Research at « Rendez-Vous Carnot 2013

For the third consecutive year, the Applied Research FIEEC Awards were presented at Rendez-Vous CARNOT, on Thursday, Oct. 10th, 2013. These prizes reward research works which, through a partnership with an SME, which helped to generate growth and employment.

The second prize rewards three researchers from the Laboratory of Electrical Engineering of Paris (LGEP) for the development of ResiScope™ II :- Olivier Schneegans Supélec Engineer and Doctor in Physics,

  • Pascal Chrétien, Research Engineer,
  • Frédéric Houzé Supélec Engineer and Doctor in Physics.This work is enhanced by two SMEs:– ScienTec, specializing in the distribution of scientific equipment dedicated to Surface Analysis and Spectroradiometry
  • Concept Scientific Instruments(CSI), SME specialised in AFM instrumentation.Based on the thesis of Olivier Schneegans, they have developed jointly the ResiScope™ II, an original equipment able to produce mapping local electrical resistance (current and resistance of 10 decades) from an Atomic Force Microscope.
 

 

Specifications

 

Resistance range 10² Ω to 10^12 Ω
Current range (ResiScope mode) 50 fA to 100 mA
AFM compatibility CSInstruments : Nano-Observer UHV : please contact us
Compatible AFM mode Contact / Tapping / AC mode EFM / MFM / KFM single-pass
Operating Environment Windows® XP. 7, 8, 10, 11, SP3 Framework DotNet 3.5 SP1 One USB port available
Power Supply AC 100‐240V 47‐63Hz, 1A The appliance must be properly grounded.
Weight (net) 2kg

Industries

  • Materials Science
  • Life Sciences
  • Semiconductors and Electronics
  • Academics
  • Others (includes solar cells, geoscience, forensic science, and food technology)

 

Applications

Photovoltaic

Oxyde characterisation

Semiconductors

All conductive characterisation

Downloads

Brochures

Resiscope Brochure

View Brochure

Application Notes

Application Note Soft Resiscope

View Application Note

Application Note Resiscope II

View Application Note

Service Support

Comprehensive repairs and servicing

Annual Support Programs

Your metrology instrumentation is a major investment that is critical to your business operation and success. In today’s competitive climate, it is more important than ever to extend the functionality and peak performance of your metrology equipment years beyond the expiration of your factory warranty. CN Tech’s Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.

With over 20 years’ experience servicing and repairing you can be assured that your system is in safe hands. The independent services we offer include system relocation, maintenance visits, parts and consumables, and break down interventions.

CN Tech’s Support Programs are an economical way to guarantee optimal working condition:

  • Annual Preventive Maintenance
  • Priority Technical Assistance
  • Preferred Parts Availability
  • On-Site User Training
  • Remote Diagnostics
  • No surprise repair expense and much more!

Support Contact Example

An example of our service and support contracts are shown below:

Brochures

Metrology & Instrumentation Annual Support Programs 2024/25

CN Tech's Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.

Get in touch to discuss your requirements

Make an enquiry

Download PDF

Please add 4 and 1.

Thank you

A download link has been sent to the e-mail address you provided.