ResiScope II
ResiScope™ II is a cutting-edge module for Atomic Force Microscopy (AFM) that enables high-precision electrical measurements. It offers unparalleled capabilities in measuring resistance and current over an exceptionally wide range, making it an indispensable tool for nanoscale electrical characterisation.
Manufacturer
CSI
CSInstruments is a French scientific equipment manufacturer specialised in the conception of Atomic Force Microscope and options designed for existing AFM (Nano-Observer AFM, Resiscope™, High Voltage Amplifier, Magnetic modules). The product range proposed by CSInstruments is designed and manufactured to help the scientific community to achieve nanometre performances that meet the research needs and requirements for actual and future nanoscience applications.
CSInstruments was founded by a team of experts working in AFM field for more than 20 years, starting as pioneer with some historical manufacturers. CSInstruments activity is also based on a qualified and dynamic team, experienced in the fields of mechanics, electronics and data processing. This expertise ensures innovation and performance in the production of AFM and achieves an excellent price/performance ratio!
Resiscope
Key Features
- AutoGain adjusted in real-time by ultra-fast Digital Signal Processor electronics
- 10 orders of magnitude range in current/resistance (100 fA to 1mA - 100 ohms to 1 Tohm)
- Both highly conductive and highly isolating domains measured in same image without user adjustment
- No logarithmic amplifiers/gains (Multiple linear gains)
- Real-time current protective integrated system
How does Resiscope II work?
ResiScope™ II is an advanced module for Atomic Force Microscopy (AFM) that enables high-precision electrical measurements at the nanoscale. Here's an overview of its working principle:
Conductive Probe:
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A conductive AFM tip scans the sample surface
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Tip acts as one electrode, sample as the other
Voltage Application:
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DC bias voltage applied between tip and sample
Current Measurement:
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Measures current flowing between tip and sample
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Current range: 50 fA to 1 mA
Resistance Calculation:
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Calculates local resistance using applied voltage and measured current
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Resistance range: 100 ohms to 1 Tohm
Fast Auto-Ranging:
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Processor-driven auto-ranging for real-time measurement adjustments
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No manual intervention needed
The unique design of ResiScope III allows for unprecedented sensitivity and range in electrical measurements, making it a powerful tool for nanoscale electrical characterisation across a wide range of materials and applications.
Specifications
| Resistance Measurement Range | 10² to 10¹² ΩCurrent |
| Measurement Range | 100 fA to 1 mA |
| Voltage Range | ±10 V (adjustable) |
| Measurement Speed | Up to 10 kHz (100 μs per measurement) |
| Auto-Ranging | Real-time, processor-driven |
| Current Control | Active, real-time adjustment |
| Noise Level | < 10 fA RMS |
| Compatible AFM Modes | Contact Mode Oscillating Mode Force Spectroscopy |
| Integration Capabilities | HD-KFM MFM/EFM PFM Environmental Compatibility:Air Controlled Atmospheres Liquids |
| Topography Acquisition | Simultaneous with electrical measurements |
| Data Output | Real-time resistance and current mapping |
| Spatial Resolution | Dependent on AFM tip radius (typically < 10 nm) |
| Software | Integrated with Nano-Observer II control software |
| Data Analysis | Built-in analysis tools for electrical property mapping |
| Compatible Probes | Wide range of commercially available conductive AFM probes |
| Scan area | Up to 100 μm x 100 μm |
| Operating Temperature | 10°C to 40°C (standard), extended range available |
| Humidity Range | < 80% RH, non-condensing |
Industries
- Materials Science
- Life Sciences
- Semiconductors and Electronics
- Academics
- Others (includes solar cells, geoscience, forensic science, and food technology)
Applications
Semiconductor Analysis
Doping profiling, defect analysis, 2D semiconductors, junction studies
Nanoelectronics Research
Nanowires, nanotubes, graphene, quantum dots, molecular electronics
Material Science
Conductive materials, composites, corrosion studies, novel materials
Polymer and Composite Studies
Conductive polymers, blends, carbon nanotube composites, organic electronics
Thin Film Characterisation
Uniformity analysis, dielectric films, TCO films, solar cell materials
Energy Materials
Battery electrodes, fuel cells, photovoltaics, thermoelectrics
Biomaterials and Bioelectronics
Conductive biomaterials, neural interfaces, biosensors
Advanced Coatings
Anti-static coatings, conductive coatings, smart coatings
Memory and Data Storage
RRAM, magnetic media, phase-change memory, spintronics
Optoelectronics
Photodetectors, LEDs, OLEDs, photovoltaic junctions
Downloads
Resiscope Brochure
Application Note Soft Resiscope
Application Note Resiscope II
Related Products
Service Support
Comprehensive repairs and servicing
Annual Support Programs
Your metrology instrumentation is a major investment that is critical to your business operation and success. In today’s competitive climate, it is more important than ever to extend the functionality and peak performance of your metrology equipment years beyond the expiration of your factory warranty. CN Tech’s Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.
With over 20 years’ experience servicing and repairing you can be assured that your system is in safe hands. The independent services we offer include system relocation, maintenance visits, parts and consumables, and break down interventions.
CN Tech’s Support Programs are an economical way to guarantee optimal working condition:
- Annual Preventive Maintenance
- Priority Technical Assistance
- Preferred Parts Availability
- On-Site User Training
- Remote Diagnostics
- No surprise repair expense and much more!
Support Contact Example
An example of our service and support contracts are shown below:
Metrology & Instrumentation Annual Support Programs 2024/25
CN Tech's Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.