
Filmetrics R50-Series
The Filmetrics R50 contact four-point probe system maps metal layer thickness, sheet resistance, sheet resistivity, sheet conductance, and sheet conductivity. The 10-decade measurement capability and large Z range make the R50 ideal for a wide variety of applications.
Manufacturer
Filmetrics
Filmetrics was founded in 1995 with the mission of making thin-film measurements simple and affordable. Our approach, borne of the microelectronics and software revolution, results in film-thickness measurements that take less than a second - by operators who can be trained in minutes.

Key Features
- Available in Four-Point Probe (4PP) and non-contact Eddy Current (EC) configurations
- 100mm sample Z range with coarse and precision height control and approach
- Sheet resistance measurement spans a ten-decade range on conductive and semi-conductive films
- User-specified sample point mapping using rectangular, linear, polar, and custom configurations
- High precision X-Y stage provides travel up to 200mm
- Easy-to-use software interface
- Compatible with all KLA sheet resistance probes

Filmetrics R50-Series Advanced Sheet Resistance Mapping System
The Filmetrics R50 is the latest innovation in KLA sheet resistance and conductivity mapping systems. The R50 design represents a culmination of over 45 years of sheet resistance technology leadership. Since the introduction of our first resistivity gauge in 1975, the KLA family of companies has revolutionised the measurement of both sheet resistance and thickness for conductive layers.
Sheet resistance monitoring is critical to any industry that utilises conductive films, from semiconductor manufacturing to the flexible electronics required to enable wearable technology. The R50 capabilities are optimised for metal film uniformity mapping, ion doping and implant characterisation, film thickness and resistivity mapping, and non-contact film thickness measurement.

Four-Point Probe Overview
4PP provides a simple and direct measurement of resistance, where a probe consisting of four conductive pins contacts a conductive surface with a controlled force, with a non-conductive blocking layer between the measured conductive layer and the substrate. The standard pin configuration applies a current across the two outside pins and measures the voltage across the two inside pins.
For measuring sheet resistance, the conductive layer thickness should be less than ½ the pin spacing of the probe. KLA pioneered the R50 dual configuration technique that measures the voltage on alternate pins, applying dynamic correction for edge effects and adjusting for pin spacing error. KLA offers a wide range of probe pin configurations for any conductive film or ion implant layer to optimise for surface material properties.

Eddy Current Overview
EC provides a non-contact technique for measuring conductive films. A time-varying current is applied through a coil to produce a time-varying magnetic field that, when brought close to a conductive surface, induces time-varying (eddy) currents in that surface. These eddy currents in turn create their own time-varying magnetic field that couples with the probe coil to create a signal change that is proportional to the sheet resistance of the sample.
KLA’s unique EC solution uses a single top side probe that dynamically adjusts for the probe sample height at each measured point, which is critical to measurement accuracy and repeatability. The EC method is unaffected by probe size or surface oxidation and is ideal for softer samples that are not well suited to the 4PP contact method.

Correlation Between 4PP and EC Methods
Whatever the application, KLA 4PP and EC solutions demonstrate over 99% correlation across the entire common range of each method. The Filmetrics R50 methods use KLA industry-leading calibration to ensure measurement accuracy regardless of technique.
Applications
Semiconductors
Compound semiconductor
Advanced packaging
Solar
Flat panel and VR display
Printed circuits
Wearable devices
Conductive materials
Metal Film Uniformity
Ion Implantation Characterisation
Film Thickness/Resistivity/Sheet Resistance
Data Acquisition and Visualisation
Downloads

R50 Brochure

Technical Note R50 Non Contact Sheet Resistance

Technical Note R50 Probe Care

Application Note Metal Film Sheet Resistance and Thickness Mapping
Service Support
Comprehensive repairs and servicing
Annual Support Programs
Your metrology instrumentation is a major investment that is critical to your business operation and success. In today’s competitive climate, it is more important than ever to extend the functionality and peak performance of your metrology equipment years beyond the expiration of your factory warranty. CN Tech’s Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.
With over 20 years’ experience servicing and repairing you can be assured that your system is in safe hands. The independent services we offer include system relocation, maintenance visits, parts and consumables, and break down interventions.
CN Tech’s Support Programs are an economical way to guarantee optimal working condition:
- Annual Preventive Maintenance
- Priority Technical Assistance
- Preferred Parts Availability
- On-Site User Training
- Remote Diagnostics
- No surprise repair expense and much more!
Support Contact Example
An example of our service and support contracts are shown below:

Metrology & Instrumentation Annual Support Programs 2024/25
CN Tech's Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.