Piezoresponse Force Microscopy Mode

Piezoresponse Force Microscopy mode (PFM) is a AFM contact mode. An electrical oscillation is applied to the conductive tip during scanning. Mapping piezoelectric orientation areas is carried out by measuring the amplitude of oscillation and the offsets of the phase signal.

Manufacturer

CSI

CSInstruments is a French scientific equipment manufacturer specialised in the conception of Atomic Force Microscope and options designed for existing AFM (Nano-Observer AFM, Resiscope™, High Voltage Amplifier, Magnetic modules). The product range proposed by CSInstruments is designed and manufactured to help the scientific community to achieve nanometer performances that meet the research needs and requirements for actual and future nanoscience applications.

CSInstruments was founded by a team of experts working in AFM field for more than 20 years, starting as pioneer with some historical manufacturers. CSInstruments activity is also based on a qualified and dynamic team, experienced in the fields of mechanics, electronics and data processing. This expertise ensures innovation and performance in the production of AFM and achieves an excellent price/performance ratio!

Key Features

An electrical oscillation is applied to the conductive tip during scanning
high sensitivity of the phase signals and amplitide
Mapping piezoelectric field See Gallery

Interests

Mapping piezoelectric field

Piezoresponsive materials are substances that undergo mechanical deformation in response to an applied voltage. Piezoresponse Force Microscopy (PFM) enables high-resolution nanoscale characterization of this piezoresponsive materials.

Benefits

High sensitivity of the phase signals and amplitide
Mapping piezoelectric field