Oscillating Mode

A tip vibrating at its resonant frequency sweeps the surface using piezoelectric motors. Laser detection maintains the amplitude of oscillation constant during the measurement. The movements of the vertical piezoelectric motor are recorded to reconstruct the surface. Mapping of mechanical properties is achieved with the offsets of the phase signal. (phase contrast).



CSInstruments is a French scientific equipment manufacturer specialised in the conception of Atomic Force Microscope and options designed for existing AFM (Nano-Observer AFM, Resiscope™, High Voltage Amplifier, Magnetic modules). The product range proposed by CSInstruments is designed and manufactured to help the scientific community to achieve nanometer performances that meet the research needs and requirements for actual and future nanoscience applications.

CSInstruments was founded by a team of experts working in AFM field for more than 20 years, starting as pioneer with some historical manufacturers. CSInstruments activity is also based on a qualified and dynamic team, experienced in the fields of mechanics, electronics and data processing. This expertise ensures innovation and performance in the production of AFM and achieves an excellent price/performance ratio!

Key Features

  • Very versatile and adapts to all types of surfaces
  • Phase shift
  • AFM oscillating mode preserve surfaces and probes
  • Lock-in included
  • Wide bandwidth frequency
  • High sensitivity in phase contrast


High sensitivity in phase contrast

AFM oscillating mode preserve surfaces and probes. It is very versatile and adapts to all types of surfaces which are rather soft such as polymer or rather hard such as micro-electronics and metals. The phase shift when the tip touches the surface provides information on mechanical properties such as hardness and elasticity. The finest tips are adapted to the modes oscillating because the contact forces between the tip and sample are particularly low.


  • Lock-in included
  • Wide bandwidth frequency
  • High sensitivity in phase contrast

Associated modes

  • MFM Mode
  • EFM Mode
  • HD-KFM Mode

Oscillating Mode Probes

  • ACL  
  • ACST/ TM190  
  • ACT/ TM300  
  • FORT/ FM60  
  • FORT-SS  
  • ACT-SS

Product range

Soft Intermittent Contact

Contact Mode

ResiScope Mode

Conductive AFM Mode

Force Modulation Mode

Piezoresponse Force Microscopy Mode

Oscillating Mode

Electric Force Microscopy Mode

Magnetic Force Microscopy Mode

VMFM – Variable Magnetic Field Module

Thermal Measurements AFM


  • Materials science
  • Semiconductor
  • Life science
  • Nanostructure
  • Polymer


  • Materials Science
  • Life Sciences
  • Semiconductors and Electronics
  • Academics
  • Others (includes solar cells, geoscience, forensic science, and food technology)


If you would like to learn more about Oscillating Mode, contact our experienced technical team today. We would be happy to help you find the right profilometry solution for your needs. Contact us today!