Nano-Observer Atomic Force Microscope
The Nano-Observer One Plus is a flexible and powerful Atomic Force Microscope that combines performance, ease of use, and affordability. Designed for both experienced researchers and newcomers to AFM, it offers a wide range of capabilities to meet your essential research needs.
Manufacturer
CSI
CSInstruments is a French scientific equipment manufacturer specialised in the conception of Atomic Force Microscope and options designed for existing AFM (Nano-Observer AFM, Resiscope™, High Voltage Amplifier, Magnetic modules). The product range proposed by CSInstruments is designed and manufactured to help the scientific community to achieve nanometre performances that meet the research needs and requirements for actual and future nanoscience applications.
CSInstruments was founded by a team of experts working in AFM field for more than 20 years, starting as pioneer with some historical manufacturers. CSInstruments activity is also based on a qualified and dynamic team, experienced in the fields of mechanics, electronics and data processing. This expertise ensures innovation and performance in the production of AFM and achieves an excellent price/performance ratio!
Key Features
- XY Scan Range: 100 μm × 100 μm (±10%)
- Z Range: 15 μm (±10%)
- High-resolution imaging with 24-bit control
- Compact AFM head with pre-positioned tip system
- Top and side views for easy tip/sample positioning
- Intuitive software for quick and safe AFM acquisitions
Why Choose Nano-Observer One Plus?
Versatility: Wide range of modes and measurements for diverse research needs
User-Friendly: Intuitive software and design for both beginners and experienced users
Performance: Achieve high-resolution imaging and precise measurements
Affordable: Advanced AFM capabilities at a competitive point
Expandable: Compatible with various environmental control options
Electric Field Microscopy
Electric Field Microscopy (EFM) is an oscillating mode. A metal tip scans the surface to record the topography. Then, the tip is over the sample and recording the offsets of the phase signal of the interactions with the gradient of electrical forces present on the surface.
Magnetic Field Microscopy
Magnetic Field Microscopy (MFM) is an oscillating mode. A magnetic tip scans the surface to record the topography. Then, the tip is over the sample and recording the offsets of the phase signal of interaction with the magnetic forces on the surface.
Conductive AFM
Conductive AFM (C-AFM) is an AFM contact mode. A conductive tip saves the current variations of the surface using an amplifier. Curves of current / voltage can be conducted at various locations on the sample.
Force Modulation Microscopy
Force modulation mode is a mode of contact AFM. A mechanical oscillation is applied to the tip during the scan. A map of mechanical properties is carried out by measuring the amplitude of oscillation and the offsets of the phase signal.
Piezo Force Microscopy
Piezo Force Microscopy (PFM) is a AFM contact mode. An electrical oscillation is applied to the conductive tip during scanning. Mapping piezoelectric orientation areas is carried out by measuring the amplitude of oscillation and the offsets of the phase signal.
Modes
Advanced AFM Modes
- HD-KFM I
- ResiScope II
- Soft Intermittent Contact
AFM Modes
- Piezoresponse Force Microscopy (PFM)
- Conductive AFM (C-AFM)
- Scanning Microwave Impedance Microscopy (sMIM)
- Electric Force Microscopy (EFM)
- Contact Mode
- Oscillating Mode
- Magnetic Force Microscopy (MFM)
- Force Modulation Mode (FMM)
AFM Accessories
- Environmental Control
- EZ Temperature
- EZ Liquids
- Electrochemical AFM
- Variable Magnetic Field Module
Scanner Specifications
| XY Scan Range | 100 μm × 100 μm (±10%) |
| Z Range | 15 μm (±10%) |
| XY Resolution | < 0.2 nm |
| Z Resolution | < 0.1 nm |
Optical Detection System
| Laser Type | Low noise laser diode |
| Detector | 4-quadrant photodiode |
| Laser Spot Size | < 50 μm |
Electrical Measurements
| ResiScope II Range | 102 to 1012 ohms |
| Voltage Range | ±10 V (adjustable) |
Controller and Data Acquisition
| Controller Resolution | 24-bit |
| Built-in Lock-in Amplifier | Up to 5 MHz |
| Maximum Data Points | 4096 × 4096 |
| Scanning Speed | Up to 8 lines/second (in 256 × 256 pixels) |
Sample Stage
| Sample Size | Up to 40 mm diameter |
| Sample Weight | Up to 80 g |
| Motorised Sample Approach | 10 mm range, 100 nm resolution |
Environmental Control (Optional)
| Temperature Range | -40°C to 300°C (with optional heating/cooling stage) |
| Humidity Control | Optional, range dependent on specific module |
| Liquid Cell | Available for imaging in fluid environments |
Applications
Materials Science
Polymers
Semiconductors
2D Materials
Biology
Energy Materials
Downloads
Nano-Observer Atomic Force Microscope Brochure
Related Products
Service Support
Comprehensive repairs and servicing
Annual Support Programs
Your metrology instrumentation is a major investment that is critical to your business operation and success. In today’s competitive climate, it is more important than ever to extend the functionality and peak performance of your metrology equipment years beyond the expiration of your factory warranty. CN Tech’s Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.
With over 20 years’ experience servicing and repairing you can be assured that your system is in safe hands. The independent services we offer include system relocation, maintenance visits, parts and consumables, and break down interventions.
CN Tech’s Support Programs are an economical way to guarantee optimal working condition:
- Annual Preventive Maintenance
- Priority Technical Assistance
- Preferred Parts Availability
- On-Site User Training
- Remote Diagnostics
- No surprise repair expense and much more!
Support Contact Example
An example of our service and support contracts are shown below:
Metrology & Instrumentation Annual Support Programs 2024/25
CN Tech's Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.