Nano Indenter® G200x
A production-proven platform, the Nano Indenter G200X is capable of measuring Young’s modulus and hardness, including deformation, from nanometres to millimetres. Complex modulus and creep response are also supported. Highly flexible and upgradeable, and designed for high throughput. The G200X system handles a wide variety of samples from hard coatings to soft polymers and offers the most comprehensive test suite available in the KLA Instruments nanoindenter product line.
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- Electromagnetic actuator to achieve the high dynamic range in force and displacement
- High resolution optical microscope and precision XYZ motion system for viewing, positioning and targeting samples.
- Easy mount sample tray with multiple sample positions for high throughput testing.
- Intuitive interface for quick test setup; testing parameters can be changed with just a few mouse clicks
- Real-time experimental control, easy test protocol development and test setup.
- Full suite of InView software including ReviewData and InFocus for analyzing data and creating reports.
- Award-winning, high-speed testing for material property maps and increased statistical confidence.
- InQuest high-speed controller electronics with 100kHz data acquisition rate and 20µs time constant.
Precise Mechanical Testing for Micro-To-Nano Range of Loads & Displacements
The Nano Indenter® G200X system is an accurate, flexible, user-friendly instrument for nanoscale mechanical testing. The Nano Indenter G200X measures Young’s modulus and hardness, including measurement of deformation over six orders of magnitude (from nanometers to millimeters). The system can also measure the complex modulus of polymers, gels and biological tissue, as well as the creep response (strain rate sensitivity) of thin metallic films. Modular system options can accommodate a variety of applications: frequency-specific testing, quantitative scratch and wear testing, integrated probe-based imaging, high-temperature testing, expanded load capacity up to 10N, and custom test protocols.
KLA Core Technology
The Nano Indenter G200X is powered by electromagnetic transducers to deliver precise measurements and avoid artifacts in the x and y axes. The system is designed to provide accurate sample positioning, easy sample viewing, and simple sample height adjustment. In its standard configuration, the G200X utilizes the XP indentation head, and a modular controller that allows users to add capabilities as needed. In addition, the G200X gives users the ability to program each transducer for specific measurements, and switch between them at any time. The system has a small footprint to conserve lab space and conforms to ISO 14577 to ensure data integrity.
The G200X system provides a wide array of imaging capabilities, including a survey scanning mode that is ideal for scratch and wear testing on large samples, or for working with large, irregularly-shaped, and/or heterogeneous samples.
Continuous Stiffness Measurement (CSM)
The CSM option measures stiffness during the indentation cycle to measure material properties as a function of depth, force, time or frequency.
AccuFilmTM allows for characterization of ultra-thin films by correcting for substrate influence on the measurement
ProbeDMATM enables dynamic mechanical analyses (DMA) on soft polymers and other materials with sample geometries and/or material volumes that are not suitable for standard DMA tests
Biomaterials Method Pack provides the ability to measure the complex modulus of biomaterials with shear moduli on the order of 1kPa . Utilizing the CSM module, the pack includes a flat-punch tip and a test method for evaluation of viscoelastic properties
NanoBlitz 3D Rapid Mechanical Property Mapping
Quickly and quantitatively maps surface mechanical properties
Gives statistically significant results due to the increased number of observations
Measures rough surfaces and/or heterogeneous materials
The NanoBlitz 3D option measures elastic modulus and hardness as a function of (x, y) position, generating thousands of data points in a short period of time. The quantitative data is combined with powerful visualization techniques to assess differences in microstructure and gradients in mechanical properties.
NanoBlitz 4D Mechanical Property Tomography
Extends the Continuous Stiffness Measurement (CSM) technique to include mechanical property tomography
To assess elastic modulus and hardness as a function of (x, y) position and depth, NanoBlitz 4D option rapidly creates a user-defined array of constant strain rate indents using the CSM module. Because each indent is performed in about 7 seconds, the system can generate a statistically significant amount of data to accurately characterize complex microstructures and components.
Scanning Probe Microscopy Options
Featuring a closed-loop nanopositioning stage for high-resolution 3D imaging and precise targeting, NanoVision allows users to target indentation test sites with nanometer-scale precision and characterize individual phases of complex materials. NanoVision users can also examine residual impressions to quantify material response phenomena such as pile-up, deformed volume and fracture toughness.
The Survey Scanning option utilizes the accurate, repeatable (x, y) motion of the Nano Indenter G200X system to provide a maximum scan size of 500μm by 500μm. The NanoVision stage and Survey Scanning options can be used together for precise location targeting for nanoindentation tests, particularly valuable for determination of sample fracture toughness.
Lateral Force Measurement (LFM) Option
The Lateral Force Measurement (LFM) option provides three-dimensional quantitative analysis for scratch testing, wear testing and MEMS probing by enabling shear force measurement in the x and y directions. Tribological studies benefit greatly from the LFM option, for determination of the critical load and coefficient of friction over the scratch length. Scratch testing applies a constant or ramped load to an indenter while moving across the sample surface, and can be used for thin films, brittle ceramics and polymers.
Nano Indenter® G200
Nano Indenter® G200X
- High speed hardness and modulus measurements (Oliver-Pharr)
- High speed material property maps
- ISO 14577 hardness testing
- Interfacial adhesion measurement
- Fracture toughness measurement
- Viscoelastic property measurements including tan delta, and storage and loss modulus
- Scanning probe microscopy (3D imaging)
- Quantitative scratch and wear testing
- High temperature nanoindentation testing
- Universities, research labs and institutes
- Semiconductor industry
- PVD/CVD hard coatings (DLC, TiN)
- MEMS: Micro-electro-mechanical systems/nanoscale universal testing
- Ceramics and glass
- Metals and alloys
- Coatings and paints
- Batteries and energy storage
- Automotive and aerospace
If you like to find out more about the powerful and flexible nano indentation capabilities offered by the Nano Indenter G200X, contact the CN Tech team today. Our technical specialists would be happy to discuss your nanoscale mechanical testing requirements, and help you find the right solution. Contact us today!