Nano Indenter® G200

A fully upgradeable, extendible, and production-proven platform with automated high-throughput hardness measurement capability. The Nano Indenter G200 can be used to measure Young’s modulus, hardness, fracture toughness, wear and scratch resistance, and more. The system is a fully upgradeable, extendible, and production-proven platform with automated hardness measurement for quality control and assurance labs.

Manufacturer

KLA

A global technology leader who make an impact by creating solutions that drive progress and transform industries. Collaboration is the key to their success. KLA provide leading-edge technology and devices using advanced inspection tools, metrology systems, and computational analytics. Their solutions accelerate tomorrow’s electronic devices. The enable evolution and innovation in the data era across key industries including automotive, mobile and data center.

 

Key Features

  • Electromagnetic Actuator to achieve the high dynamic range in force and displacement
  • Modular options for imaging scratches, high-temperature nanoindentation measurements, and dynamic testing
  • Intuitive interface for quick test setup; testing parameters can be changed with just a few mouse clicks
  • Real-time experimental control, easy test protocol development and precise thermal drift compensation
  • Award-winning, high-speed Express Test option to measure hardness and modulus
  • Versatile imaging capabilities, survey scanning, and streamlined test method development for rapid results
  • Simple determination of indenter area function and load frame stiffness

Accurate, Flexible, & User-friendly Nano Indentation

The culmination of decades of research and development, the KLA Nano Indenter G200 is the world's most accurate, flexible, and user-friendly instrument for nanoscale mechanical testing. Electromagnetic actuation allows the Nano Indenter G200 to achieve unparalleled dynamic range in force and displacement. Furthermore, KLA's innovative Express Test option, an award-winning technology that allows the world's fastest nanoindentation for mechanical-properties mapping, is compatible with all G200 indentation DCMII and XP heads, and stages.

The Nano Indenter G200 enables users to measure Young's modulus and hardness in compliance with ISO 14577. The G200 also enables measurement of deformation over six orders of magnitude (from nanometers to millimeters). Modular options can be added to accommodate a variety of applications. The capabilities of the G200 can be extended to facilitate frequency-specific testing, quantitative scratch and wear testing, integrated probe-based imaging, high-temperature testing, expanded load capacity up to 10N, and customizable test protocols.

With the Nano Indenter G200, users are able to quantify the relationship between structure, properties, and performance of their materials quickly and easily with minimal sample preparation. The user-friendly design of the G200 simplifies training requirements - standard tests can be run on the same day the instrument is installed. Every G200 is backed by highly responsive KLA customer service personnel. Knowledgeable and experienced regional applications engineers are available to guide users through more advanced testing, provide outstanding technical support, and offer unmatched applications expertise.

Advanced Design

All nanoindentation experiments rely on the accuracy of the fundamental load and the displacement data, requiring the highest precision control of load applied to the sample. The Nano Indenter G200 is powered by electromagnetic actuation-based force transducers to ensure precise measurements. The instrument's unique design avoids lateral displacement artifacts.

Among the many benefits of the Nano Indenter G200 design are convenient access to the entire sample tray, excellent sample positioning accuracy, easy viewing of the sample position and the sample work area, and simplicity in sample height adjustment to speed test throughput. The modular controller design is optimized for future upgrades. In addition, the G200 conforms to ISO 14577 to ensure data integrity, gives users the ability to program experiments with each force transducer and switch between them at any time, and has an optimized lateral footprint to conserve lab space.

Enhanced NanoSuite Professional Software

Every Nano Indenter G200 comes with KLA NanoSuite Professional software, a premium-performance package that gives researchers in scientific and industrial settings an unprecedented combination of speed, flexibility, and ease of use. NanoSuite offers a variety of prewritten test methods, including an exclusive nanoindentation technique for making substrate-independent measurements of thin film materials, several novel techniques for testing polymers, and improved scratch test methods. KLA's field-proven method for testing in compliance with ISO 14577, the international standard for indentation testing, is provided as well.

NanoSuite includes a fully integrated tool that greatly simplifies the determination of indenter area function and load-frame stiffness. Once a rather involved and time-consuming endeavor, this process now requires only a couple of mouse-clicks within the NanoSuite > 6.2 program. Prewritten methods for testing gels (DCM II indentation head and CSM option required) and for measuring strain-rate sensitivity (XP indentation head and CSM option required). Additional new capabilities allow a standard batch of tests comprising 25 or more samples to be set up in 5 minutes or less, 2D and 3D graphs and histograms to be plotted on-screen and exported directly to Microsoft Excel while preserving all labels and scales, and sample files to be organized by project and subproject. NanoSuite > 6.2 also provides Microsoft Windows 7 (32-bit) compliance for current systems and a convenient PDF printer to replace hardware printers.

As in the package's previous iteration, an intuitive interface allows users to set up and run experiments quickly - changing test parameters as often as desired - with just a few clicks. NanoSuite > 6.2 offers support of small force/displacement measurements, surface topology, stiffness mapping, scratch tests, and more. Versatile imaging capabilities, a survey scanning option, and streamlined test method development help researchers get from testing to results in record time.

Product range

uNano™
iNano®
iMicro
Nano Indenter® G200
Nano Indenter® G200X

Applications

  • High-speed hardness and modulus measurement
  • Interfacial adhesion measurement
  • Fracture toughness measurement
  • Viscoelastic properties measurement
  • Scanning probe microscopy (3D imaging)
  • Wear and scratch resistance
  • High-temperature nanoindentation

Industries

  • Universities, research labs and institutes
  • Semiconductor and electronics industry manufacturing
  • Tire industry
  • Coating and paint industry
  • Biomedical industry
  • Medical devices
  • And more: Contact us with your requirements

Options

XP Head

The Nano Indenter G200 system is powered by an electromagnetic transducer to ensure precise measurements. The transducer’s unique design avoids lateral displacement artifacts. The standard XP indentation head is equipped with a loading capability of 500mN, delivering < 0.01nm (10pm) displacement resolution and> 500μm maximum indentation depth.

Dynamic Contact Module II (DCM II) head

The Continuous Stiffness Measurement (CSM) technique, compatible with both the XP and the DCM II indentation heads, satisfies application requirements that must take into account dynamic effects, such as strain rate and frequency. The ProbeDMA™ Polymer Method Pack and the AccuFilm™ Thin Film Method Pack are included with the CSM option. The ProbeDMA™ Polymer Method Pack offers a means of separating the in-phase and out-of-phase components of the load-displacement history. Phase separation enables accurate determination of the location of initial surface contact, and continuous measurement of contact stiffness as a function of depth or frequency, eliminating the need for unloading cycles. The AccuFilm™ Thin Film Method Pack measures substrate-independent material properties.

Express Test

The Express Test option is a novel, fast way to conduct high-precision nanomechanical tests. A recipient of the R&D 100 Award, the Express Test option performs one complete indentation every second, meaning that 100 indentations can be performed at 100 different sites in 100 seconds. The Express Test option is compatible with all Nano Indenter G200 DCM II and XP indentation heads and all stages. Versatile, easy-to-use Express Test methods are ideal for applications involving metals, glasses, ceramics, structural polymers, thin films and low-k materials. One Express Test method for thin film measurements incorporates a thin-film model that automatically accounts for the substrates’ influence on the measurement, allowing rapid, accurate measurement of Young’s modulus.

Laser-heated tip and stage

Compatible with the standard XP indentation head, the laser-heated tip and stage option for the Nano Indenter G200 system uses a high-power diode laser to heat the tip and the sample to the same temperature. Advantages include the ability to measure various nanomechanical properties at precisely controlled temperatures or under highly dynamic temperature conditions. To ensure accurate data, the system minimizes drift associated with heating by using a heated tip, and by using a laser as a heating source (not resistive heating). The G200 also gives users the option to purge samples with various gases to avoid contamination and oxidation.

Lateral Force Measurement (LFM)

The Lateral Force Measurement (LFM) option provides three-dimensional quantitative analysis for scratch testing, wear testing and MEMS probing. This option enables shear force measurement in the X and Y directions. Tribological studies benefit greatly from the LFM option, for determination of the critical load and coefficient of friction over the scratch length.

High Load

Designed for use with the standard XP indentation head, the High Load option expands the load capabilities of the Nano Indenter G200 system up to 10N, allowing complete mechanical characterization of ceramics, bulk metals and composites. The High Load option has been engineered to avoid sacrificing the instrument’s load and displacement resolutions at low forces, and seamlessly engage at the point in the test protocol when extra force is required.

NanoVision

The NanoVision option features a closed-loop nanopositioning stage for high-resolution 3D imaging and precise targeting. NanoVision allows users to target indentation test sites with nanometer-scale precision, and characterize individual phases of complex materials. NanoVision users can also examine residual impressions to quantify material response phenomena such as pile-up, deformed volume and fracture toughness.

Survey Scanning

The Survey Scanning option utilizes the accurate, repeatable X/Y motion of the Nano Indenter G200 system to provide a maximum scan size of 500μm by 500μm. The NanoVision stage and Survey Scanning options can be used together for precise location targeting for nanoindentation tests, particularly valuable for determination of sample fracture toughness.

NanoSuite ® Software Versions

All Nano Indenter G200 systems are powered by the standard NanoSuite Professional software. The NanoSuite Professional version gives users access to pre-written test methods, including methods that comply with ISO 14577 and methods that remove substrate-related artifacts from samples with thin-film materials. The NanoSuite Explorer version enables researchers to write their own NanoSuite methods using a simple protocol. With Simulation Mode, available with both NanoSuite Professional and NanoSuite Explorer software, users can write test methods, process and analyze data offline.

Downloads

Nano Indenter® G200 Brochure

Nano Indenter® G200 Brochure

Brittle-to-Ductile Plasticity Transition Behavior Study of Silicon using High- Temperature Nanoindentation

Brittle-to-Ductile Plasticity Transition Behavior Study of Silicon using High- Temperature Nanoindentation

Cross-Sectional DMA Testing on Automotive Tires Using Continuous Stiffness Measurement on Nanoindentation.

Cross-Sectional DMA Testing on Automotive Tires Using Continuous Stiffness Measurement on Nanoindentation.

Evaluation of Failure in Low k Films Using Stiffness Mapping and Dynamic Imaging

Evaluation of Failure in Low k Films Using Stiffness Mapping and Dynamic Imaging

Effect of Annealing on 50nm Gold Films

Effect of Annealing on 50nm Gold Films

Imaging and Testing Dry and Hydrated Fixed Mouse Lung Endothelial Cells Using a Nanoindenter

Imaging and Testing Dry and Hydrated Fixed Mouse Lung Endothelial Cells Using a Nanoindenter

In Vitro Complex Shear Modulus of Bovine Muscle Tissue (Steak)

In Vitro Complex Shear Modulus of Bovine Muscle Tissue (Steak)

Instrumented Indentation Testing with the KLA Nano Indenter® systems

Instrumented Indentation Testing with the KLA Nano Indenter® systems

Nanoindentation of a Multiphase Composite with NanoVision

Nanoindentation of a Multiphase Composite with NanoVision

Scratch Testing of Low k Dielectric Films and a Correlation Study of the Results

Scratch Testing of Low k Dielectric Films and a Correlation Study of the Results

Mechanical Characterization of Sol-Gel Coatings Using KLA Nano Indenter systems

Mechanical Characterization of Sol-Gel Coatings Using KLA Nano Indenter systems

Strain Rate Sensitivity of Thin Metal Films by Instrumented Indentation

Strain Rate Sensitivity of Thin Metal Films by Instrumented Indentation

Nano Indenter Product Family Line Card

Nano Indenter Product Family Line Card

To find out more about the comprehensive nanoscale mechanical testing capabilities provided by the Nano Indenter® G200, contact our dedicated technical team today. The specialists at CN Tech are keen to discuss your nano indentation requirements, and help you find the ideal solution. Contact us today!