Magnetic domains mapping
Magnetic Force Microscopy is an AFM mode that maps the magnetic force gradient on the sample surface. MFM can be used to image both naturally occurring or written domain structures in magnetic materials.
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CSI
CSInstruments is a French scientific equipment manufacturer specialised in the conception of Atomic Force Microscope and options designed for existing AFM (Nano-Observer AFM, Resiscope™, High Voltage Amplifier, Magnetic modules). The product range proposed by CSInstruments is designed and manufactured to help the scientific community to achieve nanometer performances that meet the research needs and requirements for actual and future nanoscience applications.
CSInstruments was founded by a team of experts working in AFM field for more than 20 years, starting as pioneer with some historical manufacturers. CSInstruments activity is also based on a qualified and dynamic team, experienced in the fields of mechanics, electronics and data processing. This expertise ensures innovation and performance in the production of AFM and achieves an excellent price/performance ratio!
Magnetic domains mapping
Magnetic Force Microscopy is an AFM mode that maps the magnetic force gradient on the sample surface. MFM can be used to image both naturally occurring or written domain structures in magnetic materials.
Benefits
Soft Intermittent Contact
Contact Mode
ResiScope Mode
Conductive AFM Mode
Force Modulation Mode
Piezoresponse Force Microscopy Mode
Oscillating Mode
Electric Force Microscopy Mode
Magnetic Force Microscopy Mode
VMFM – Variable Magnetic Field Module
Thermal Measurements AFM
If you would like to learn more about Magnetic Force Microscopy Mode, contact our experienced technical team today. We would be happy to help you find the right profilometry solution for your needs. Contact us today!
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