Magnetic Force Microscopy Mode

Magnetic Force Microscopy Mode (MFM) is an oscillating mode. A magnetic tip scans the surface to record the topography. Then, the tip is over the sample and recording the offsets of the phase signal of interaction with the magnetic forces on the surface.

Manufacturer

CSI

CSInstruments is a French scientific equipment manufacturer specialised in the conception of Atomic Force Microscope and options designed for existing AFM (Nano-Observer AFM, Resiscope™, High Voltage Amplifier, Magnetic modules). The product range proposed by CSInstruments is designed and manufactured to help the scientific community to achieve nanometer performances that meet the research needs and requirements for actual and future nanoscience applications.

CSInstruments was founded by a team of experts working in AFM field for more than 20 years, starting as pioneer with some historical manufacturers. CSInstruments activity is also based on a qualified and dynamic team, experienced in the fields of mechanics, electronics and data processing. This expertise ensures innovation and performance in the production of AFM and achieves an excellent price/performance ratio!

Key Features

Study of magnetic materials
Mapping of gradient electric field
High sensitivity of the phase signals and amplitude

Interests

Magnetic domains mapping

Magnetic Force Microscopy is an AFM mode that maps the magnetic force gradient on the sample surface. MFM can be used to image both naturally occurring or written domain structures in magnetic materials.

Benefits

Study of magnetic materials
Mapping of gradient electric field
High sensitivity of the phase signals and amplitude