F50 Series Automatic Thin Film Mapping Analyser

Produce polar, rectangular or linear thickness maps as quickly as 2 points per second, with Filmetrics’ F50 series automatic thin film analysers. Robust and reliable, and simple to set up and use. Multiple models available supporting different thickness ranges. The F50 film thickness mapping system connects to the USB port of your Windows® computer and can be set up in minutes.



Filmetrics was founded in 1995 with the mission of making thin-film measurements simple and affordable. Our approach, borne of the microelectronics and software revolution, results in film-thickness measurements that take less than a second - by operators who can be trained in minutes.


Key Features

  • Intuitive Analysis Software
  • 1.5mm to 150μm Spot Size
  • Large Material Reference Library
  • Wide Spectrometer Wavelength Range
  • Measures up to 2 Points per Second
  • Maximum 450mm Sample Diameter

Automatic Film Thickness Mapping

The F50 Series of automated film thickness mapping systems and produce thickness maps quickly and accurately. Mapping speed can be as fast as 2 points per second, which makes producing thickness maps quick and efficient. The motorised R-Theta stage can accept stand and custom chucks, and samples up to 450mm in diameter, and is robust and reliable.

Thickness maps can be produced in polar, rectangular, and liner forms. Custom map types can also be configured, with no limit on the number of measurement points. Multiple pre-defined map patterns are included.

Filmetrics’ also provides access to comprehensive online support, including diagnostics and applications support, available 24 hours a day.

Visualise Thickness in 2D & 3D with FILMapper

Filmetrics’ FILMapper software is simple and easy to use, requiring minimal user training. A library of over 130 materials is built in, with access to thousands more available. A selection of map types is included, or custom maps can be configured. Customisable mapping parameters include map shape and pattern, centre or edge exclusion, and spot density. Maps can be switched between 2D and 3D views, with 3D view freely rotatable.

Shown left: 2D map of sample
Shown right: 3D view of sample

Model Specifications

Wavelength Range

No Backside Preparation Necessary

Our exclusive probe design rejects 98% of backside reflections on substrates 1.5mm thick, and rejects even more on thicker lenses. Like all of our thin-film measurement systems, the F10-AR connects to the USB port of your Windows® computer and sets up in minutes.

What’s Included

  • Integrated spectrometer/light source unit
  • fiber optic cable
  • 4", 6" and 200mm wafer reflectance standards
  • TS-SiO2-4-7200 Thickness standard
  • BK7 reflectance standard
  • Flattening filter (for highly-reflective substrates)
  • Vacuum pump
  • Spare TH-1 lamp

Additional Perks

  • Library with over 130 materials included with every system, along with access to 100s more
  • Applications Engineers available for immediate 24-hour assistance (Mon-Fri)
  • Online "Hands On" support
  • Hardware upgrade program

Product range



NIST-traceable thickness standard

F50 chuck - 100mm 200mm 300mm and 450mm (F50-450 req'd for 450mm chuck)

F50 small spot option VIS or UV


F50 Series Automatic Thin Film Mapping Analyser Brochure

F50 Series Automatic Thin Film Mapping Analyser Brochure

If you would like to receive more information about the automatic mapping capabilities of the Filmetrics F50 series, contact us today. CN Tech’s dedicated team of technical experts would be happy to discuss your film thickness measurement needs. Contact us today!