F40 Series Microscopic Spot Thin Film Analyser

F40 Series Microscopic Spot Thin Film Analyser

The F40 product family is for applications that require a spot size as small as 1 micron. For most microscopes, the F40 simply attaches to the Cmount adapter, which is the industry standard for video camera mounting.

Manufacturer

Filmetrics

Filmetrics was founded in 1995 with the mission of making thin-film measurements simple and affordable. Our approach, borne of the microelectronics and software revolution, results in film-thickness measurements that take less than a second - by operators who can be trained in minutes.

Key Features

  • Mounts Easily to Existing Microscopes
  • Simple & Accurate Objective Calibration
  • Integrated Colour Video Camera
  • Measures in Under a Second
  • Over 130 Preconfigured Materials
  • Objective Dependant Spot Size

Turn a Microscope into a Film Thickness Analyser

Filmetrics have developed the F40 Series of film thickness measurement tools for applications requiring a spot size as small as 1 micron. The F40 series is designed to fit onto an existing microscope, upgrading it for thin film measurement. Compatible with many microscopes, the F40 attaches to a microscope’s C-mount adapter. An integrated colour video camera allows for exact, real-time monitoring of the film thickness measurement spot, allowing for easy and accurate measurement placement. Filmetrics’ technology is fast, with film thickness and refractive index being measured in under a second. A range of thickness ranges are supported, and a variety of accessories are available to suit all applications.

Software Designed with the User in Mind

Filmetrics have developed the FILMeasure software package to make thin film measurement as simple and efficient as possible. FILMeasure is straightforward and intuitive to use, even for inexperienced operators. With a library of over 130 materials included as standard, and thousands more available from Filmetrics, FILMeasure can handle a wide range of applications. For new and novel materials, the refractive index values can be easily measured. Measurement recipes can be programmed and secured, to simplify taking repeated measurements, such as in quality control applications. This ensures measurements are reliable and protects against user error.

Model Specifications

Thickness and Wavelength Range

Model Specifications

Thickness Measurement Range

No Backside Preparation Necessary

Our exclusive probe design rejects 98% of backside reflections on substrates 1.5mm thick and rejects even more on thicker lenses. Like all our thin-film measurement systems, the F10-AR connects to the USB port of your Windows® computer and sets up in minutes.

What’s Included

  • Integrated spectrometer/light source unit
  • FILMeasure 9 software
  • FILMeasure standalone software for remote data analysis
  • MA-Cmount microscope adapter with Cmount fitting
  • Fiber optic patch cable
  • BK7 reflectance standard
  • TS-Focus-SiO2-4-10000 Focus/Thickness standard
  • BG-Microscope for taking background baseline

Additional Perks

  • Library with over 130 materials included with every system, along with access to 100s more
  • Applications Engineers available for immediate 24-hour assistance (Mon-Fri)
  • Online "Hands On" support
  • Hardware upgrade program

Downloads

Brochures

F40 Series Microscopic Spot Thin Film Analyser Brochure

View Brochure

Options

Multi-value thickness standard

SiO2-on-Si multiple thickness standard: 125Å, 250Å, 500Å, 1000Å, 5000Å, and 10000Å (actual thicknesses +/-10% nominal values, accurate to within 2Å), on 6 inch wafer.

NIST-traceable thickness standard

SiO2-on-Si thickness standard, approx 7200Å thick, 4 inch wafer.

SS-Microscope-UVX-1

Microscope (15x Reflective objective) w/ X-Y stage. UV light source & illumination fibre included.

SS-Microscope-EXR-1

Microscope w/ X-Y stage and illumination fibre. Requires objective lens. Light source is assumed to be F40.

StageBase-XY10-Auto-100mm

10" x 10" Stage with 100mm of precision X-Y-Focus travel, motorised mapping and autofocus.

Service Support

Comprehensive repairs and servicing

Annual Support Programs

Your metrology instrumentation is a major investment that is critical to your business operation and success. In today’s competitive climate, it is more important than ever to extend the functionality and peak performance of your metrology equipment years beyond the expiration of your factory warranty. CN Tech’s Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.

With over 20 years’ experience servicing and repairing you can be assured that your system is in safe hands. The independent services we offer include system relocation, maintenance visits, parts and consumables, and break down interventions.

CN Tech’s Support Programs are an economical way to guarantee optimal working condition:

  • Annual Preventive Maintenance
  • Priority Technical Assistance
  • Preferred Parts Availability
  • On-Site User Training
  • Remote Diagnostics
  • No surprise repair expense and much more!

Support Contact Example

An example of our service and support contracts are shown below:

Brochures

Metrology & Instrumentation Annual Support Programs 2022/23

CN Tech's Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.

Get in touch to discuss your requirements

Make an enquiry

Download PDF

Please calculate 9 plus 8.

Thank you

A download link has been sent to the e-mail address you provided.