F40 Series Microscopic Spot Thin Film Analyser

To learn more about KLA’s Zeta range of 3D optical profilers, contact the technical experts at CN Tech today. We would be happy to provide more information, and discuss your surface profilometry requirements in more detail. Contact us today to find out more.

Manufacturer

Filmetrics

Filmetrics was founded in 1995 with the mission of making thin-film measurements simple and affordable. Our approach, borne of the microelectronics and software revolution, results in film-thickness measurements that take less than a second - by operators who can be trained in minutes.

 

Key Features

  • Mounts Easily to Existing Microscopes
  • Simple & Accurate Objective Calibration
  • Integrated Colour Video Camera
  • Measures in Under a Second
  • Over 130 Preconfigured Materials
  • Objective Dependant Spot Size

Turn a Microscope into a Film Thickness Analyser

Filmetrics have developed the F40 Series of film thickness measurement tools for applications requiring a spot size as small as 1 micron. The F40 series is designed to fit onto an existing microscope, upgrading it for thin film measurement. Compatible with many microscopes, the F40 attaches to a microscope’s C-mount adapter.

An integrated colour video camera allows for exact, real-time monitoring of the film thickness measurement spot, allowing for easy and accurate measurement placement. Filmetrics’ technology is fast, with film thickness and refractive index being measured in under a second. A range of thickness ranges are supported, and a variety of accessories are available to suit all applications.

Software Designed with the User in Mind

Filmetrics have developed the FILMeasure software package to make thin film measurement as simple and efficient as possible. FILMeasure is straightforward and intuitive to use, even for inexperienced operators. With a library of over 130 materials included as standard, and thousands more available from Filmetrics, FILMeasure can handle a wide range of applications. For new and novel materials, the refractive index values can be easily measured.

Measurement recipes can be programmed and secured, to simplify taking repeated measurements, such as in quality control applications. This ensures measurements are reliable, and protects against user error.

Model Specifications

Thickness and Wavelength Range

Model Specifications

Wavelength Range

No Backside Preparation Necessary

Our exclusive probe design rejects 98% of backside reflections on substrates 1.5mm thick, and rejects even more on thicker lenses. Like all of our thin-film measurement systems, the F10-AR connects to the USB port of your Windows® computer and sets up in minutes.

What’s Included

  • Integrated spectrometer/light source unit
  • FILMeasure 9 software
  • FILMeasure standalone software for remote data analysis
  • MA-Cmount microscope adapter with Cmount fitting
  • Fiber optic patch cable
  • BK7 reflectance standard
  • TS-Focus-SiO2-4-10000 Focus/Thickness standard
  • BG-Microscope for taking background baseline

Additional Perks

  • Library with over 130 materials included with every system, along with access to 100s more
  • Applications Engineers available for immediate 24-hour assistance (Mon-Fri)
  • Online "Hands On" support
  • Hardware upgrade program

Options

Multi-value thickness standard

NIST-traceable thickness standard

SS-Microscope-UVX-1

SS-Microscope-EXR-1

StageBase-XY10-Auto-100mm

Downloads

F40 Series Microscopic Spot Thin Film Analyser Brochure

F40 Series Microscopic Spot Thin Film Analyser Brochure

To learn more about KLA’s Zeta range of 3D optical profilers, contact the technical experts at CN Tech today. We would be happy to provide more information, and discuss your surface profilometry requirements in more detail. Contact us today to find out more. Contact us today!