Filmetrics® F32 Series In-Line Thin Film Analyser
Measure the reflectance, thickness, and deposition rates of the top and bottom of a film in real time. Full integration is possible with production systems. Filmetrics’ F32 series can improve the efficiency of film deposition through effective measurement. Measurement data can be exported automatically to the host software for statistical process control (SPC). Filmetrics® also provides optional lens assemblies for easy integration onto existing production fixtures.
Key Features
- Improves Productivity
- Accurate Greater Than ±1%
- Fast Measurement in Seconds
- Non-Invasive Measurement
- Easy to Operate
- Turn-Key Setup
Manufacturer
KLA
A global technology leader who make an impact by creating solutions that drive progress and transform industries. Collaboration is the key to their success. KLA provide leading-edge technology and devices using advanced inspection tools, metrology systems, and computational analytics. Their solutions accelerate tomorrow’s electronic devices. They enable evolution and innovation in the data era across key industries including automotive, mobile and data centre.
A Compact Solution for Comprehensive In-Line Measurement
The Filmetrics F32 series of in-line thin film analysers provides a quick and easy measurement method for production workflows. The technology uses spectral analysis of reflectance from the top and bottom of a film to generate thickness information in real time. The F32 is available in a range of models supporting a variety of thickness ranges. The system is compact, fitting into a half-width 3U rack mountable chassis. Up to 4 measurement locations can be monitored and measurement can be controlled through external digital control, and measurement data can be exported for statistical process control. Filmetrics’ FILMeasure software includes a library of over 130 preconfigured materials, and has access to thousands more. New materials can also be added which makes the F32 series simple to integrate into existing workflows.
Model Specifications
Thickness and Wavelength Range
Model Specifications
Thickness Measurement Range
What’s Included
- Integrated spectrometer/light source unit
- FILMeasure 8 software
- FILMeasure standalone software for remote data analysis
- Flattening filter (for highly-reflective substrates)
- Reflectance standards
- Spare TH-2 lamp
Additional Perks
- Library with over 130 materials included with every system, along with access to 100s more
- Applications Engineers available for immediate 24-hour assistance (Mon-Fri)
- Online "Hands On" support
- Hardware upgrade program
Downloads
F32 Series In-Line Thin Film Analyser Brochure
Options
NIST-traceable thickness standard
Lens assemblies
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Comprehensive repairs and servicing
Annual Support Programs
Your metrology instrumentation is a major investment that is critical to your business operation and success. In today’s competitive climate, it is more important than ever to extend the functionality and peak performance of your metrology equipment years beyond the expiration of your factory warranty. CN Tech’s Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.
With over 20 years’ experience servicing and repairing you can be assured that your system is in safe hands. The independent services we offer include system relocation, maintenance visits, parts and consumables, and break down interventions.
CN Tech’s Support Programs are an economical way to guarantee optimal working condition:
- Annual Preventive Maintenance
- Priority Technical Assistance
- Preferred Parts Availability
- On-Site User Training
- Remote Diagnostics
- No surprise repair expense and much more!
Support Contact Example
An example of our service and support contracts are shown below:
Metrology & Instrumentation Annual Support Programs 2024/25
CN Tech's Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.