F32 Series In-Line Thin Film Analyser

Measure the reflectance, thickness, and deposition rates of the top and bottom of a film in real time. Full integration is possible with production systems. Filmetrics’ F32 series can improve the efficiency of film deposition through effective measurement. Measurement data can be exported automatically to the host software for statistical process control (SPC). Filmetrics® also provides optional lens assemblies for easy integration onto existing production fixtures.



Filmetrics was founded in 1995 with the mission of making thin-film measurements simple and affordable. Our approach, borne of the microelectronics and software revolution, results in film-thickness measurements that take less than a second - by operators who can be trained in minutes.

Key Features

  • Improves Productivity
  • Accurate Greater Than ±1%
  • Fast Measurement in Seconds
  • Non-Invasive Measurement
  • Easy to Operate
  • Turn-Key Setup

A Compact Solution for Comprehensive In-Line Measurement

The Filmetrics F32 series of in-line thin film analysers provides a quick and easy measurement method for production workflows. The technology uses spectral analysis of reflectance from the top and bottom of a film to generate thickness information in real time. The F32 is available in a range of models supporting a variety of thickness ranges. The system is compact, fitting into a half-width 3U rack mountable chassis. Up to 4 measurement locations can be monitored and measurement can be controlled through external digital control, and measurement data can be exported for statistical process control. Filmetrics’ FILMeasure software includes a library of over 130 preconfigured materials, and has access to thousands more. New materials can also be added which makes the F32 series simple to integrate into existing workflows.

Model Specifications

Thickness and Wavelength Range

Model Specifications

Thickness Measurement Range

What’s Included

  • Integrated spectrometer/light source unit
  • FILMeasure 8 software
  • FILMeasure standalone software for remote data analysis
  • Flattening filter (for highly-reflective substrates)
  • Reflectance standards
  • Spare TH-2 lamp

Additional Perks

  • Library with over 130 materials included with every system, along with access to 100s more
  • Applications Engineers available for immediate 24-hour assistance (Mon-Fri)
  • Online "Hands On" support
  • Hardware upgrade program



F32 Series In-Line Thin Film Analyser Brochure

View Brochure


NIST-traceable thickness standard

Lens assemblies

Service Support

Comprehensive repairs and servicing

Annual Support Programs

Your metrology instrumentation is a major investment that is critical to your business operation and success. In today’s competitive climate, it is more important than ever to extend the functionality and peak performance of your metrology equipment years beyond the expiration of your factory warranty. CN Tech’s Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.

With over 20 years’ experience servicing and repairing you can be assured that your system is in safe hands. The independent services we offer include system relocation, maintenance visits, parts and consumables, and break down interventions.

CN Tech’s Support Programs are an economical way to guarantee optimal working condition:

  • Annual Preventive Maintenance
  • Priority Technical Assistance
  • Preferred Parts Availability
  • On-Site User Training
  • Remote Diagnostics
  • No surprise repair expense and much more!

Support Contact Example

An example of our service and support contracts are shown below:


Metrology & Instrumentation Annual Support Programs 2022/23

CN Tech's Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.

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