F32 Series In-Line Thin Film Analyser

Measure the reflectance, reflectance, thickness and deposition rates of the top and bottom of a film in real time. Full integration is possible with production systems. Filmetrics’ F32 series can improve the efficiency of film deposition through effective measurement Measurement data can be exported automatically to the host software for statistical process control (SPC). Filmetrics® also provides optional lens assemblies for easy integration onto existing production fixtures.



Filmetrics was founded in 1995 with the mission of making thin-film measurements simple and affordable. Our approach, borne of the microelectronics and software revolution, results in film-thickness measurements that take less than a second - by operators who can be trained in minutes.


Key Features

  • Improves Productivity
  • Accurate Greater Than ±1%
  • Fast Measurement in Seconds
  • Non-Invasive Measurement
  • Easy to Operate
  • Turn-Key Setup

A Compact Solution for Comprehensive In-Line Measurement

The Filmetrics F32 series of in-line thin film analysers provides a quick and easy measurement method for production workflows. The F32 technology uses spectral analysis of reflectance from the top and bottom of a film to generate thickness information in real time. The F32 is available in a range of models supporting a variety of thickness ranges.

The F32 series system is compact, fitting into a half-width 3U rack mountable chassis. Up to 4 measurement locations can be monitored. Measurement can be controlled through external digital control, and measurement data can eb exported for statistical process control.

Filmetrics’ FILMeasure software includes a library of over 130 preconfigured materials, and has access to thousands more. New materials can also be added. This makes the F32 series simple to integrate into existing workflows.

Model Specifications

Thickness and Wavelength Range

Model Specifications

Wavelength Range

What’s Included

  • Integrated spectrometer/light source unit
  • FILMeasure 8 software
  • FILMeasure standalone software for remote data analysis
  • Flattening filter (for highly-reflective substrates)
  • Reflectance standards

Additional Perks

  • Library with over 130 materials included with every system, along with access to 100s more
  • Applications Engineers available for immediate 24-hour assistance (Mon-Fri)
  • Online "Hands On" support
  • Hardware upgrade program

Product range



NIST-traceable thickness standard

Lens assemblies


F32 Series In-Line Thin Film Analyser Brochure

F32 Series In-Line Thin Film Analyser Brochure

Would you like to learn more about how Filmetrics’ F30 series of in-line film thickness measurement systems and con improve the efficiency of film deposition? Contact our experienced technical team today to discuss your workflow, and let us help you find the right measurement solution for you.