EM-30N

The EM-30N can deliver clear images without noise, even at high magnification. The panorama feature enables the EM-30N to scan an even wider area. It's full compatibility with EDS (energy dispersive spectroscopy) delivers optimised performance.

Manufacturer

COXEM

COXEM manufactures and provides Scanning Electron Microscope (SEM), the most widely used platform technology in Nano- Metrology of Nano-scale. As a partner of Nano-fusion technology that changes industrial condition in 21 century, COXEM tries to provide the best quality service. SEM is the precision instrument, can be used for analysing the shapes or constituents of microstructure materials in quantitative and qualitative. SEM is an essential instrument for development of basic science and an indispensable infra for technical innovation, used in chemistry, biology, material science as well as nano-materials and nano-biology.

CN Tech are the exclusive Coxem distributor for:

United Kingdom and Republic of Ireland.

Key Features

  • High magnification observation of images
  • Dual display mode
  • Various methods for particle analysis
  • Performs TEM analysis of samples on standard TEM grids
  • EDS can be used on up to 4 samples mounted simultaneously
  • SE & BSE Imaging

Effect Of High Resolution

EM-30N boasts the advantage that it enables high magnification observation of images. Moreover, it can effectively get high-resolution images by adjusting the voltage, operational distance, and electronic beam size.

Dual Display / Signal Mixing Mode

Dual Display Mode

The dual display mode delivers SE and BSE images in a single-view presentation.

Signal Mixing Mode

Combining SE and BSE images provides a single-view access to the forms and chemical composition of samples.

Duplex Navi

The NanoStation interface provides multiple means of navigation simply by clicking within any of the three different magnified views:

1) A micro view using the CCD Navi Cam or Sample Holder map to move from sample to sample or areas of a large sample.

2) A micro view using the low magnification MiniMap image with a Field of View (FOV) indicator to move within a sample.

3) A nano view at the desired FOV allows movement by clicking in the image or using the Image Shift controls to make nanometre movements for perfect centring and alignment of sample features of interest.

Particle Analysis

Particle analysis can be done with various methods, and accurate analysis is ensured even for composite samples.

STEM Analysis

Coxem offers a true, retractable STEM detector enabling the EM-30N to perform TEM analysis of samples on standard TEM grids using our higher kV capability than other Tabletop SEM models. Imaging in both Bright and Dark field is possible as well as using EDS on up to 4 samples mounted simultaneously.

Coolstage

Performing SEM observations of moist samples requires a variety of pre-treatments such as critical point drying and fixation. To shorten such complex sample preparation procedures, the COXEM Coolstage lowers the temperature of the sample to freeze internal moisture preventing the damaging effects of vacuum on delicate microstructure.

Low Vacuum Mode

Using the low vacuum (LV) mode, it's easy to get an image of non-conductive samples or insulating materials without involving any special pre-treatment.

Dual Image / Signal Mixing Mode

Electron microscope can realise images by collecting the different signals generated from samples with electronic beam. The SE detector can get data as created by ruggedness by capturing secondary electrons (SE), and the backscattered electrons (BSE) collected with the BSE detector can get the elementary composition and stereoscopic images of the samples. It also performs signal merging, which presents the images of the forms and shapes of samples on a single screen.

Model Specifications

Model EM-30 EM-30AX EM-30N EM-30AXN
Magnification 15-150,000X 15-150,000X 15-150,000X 15-150,000X
Spatial Resolution <5nm at 30kV <5nm at 30kV <5nm at 30kV <5nm at 30kV
Acceleration Voltage 1 - 30kV (adjustable in 1kV scale) 1 - 30kV (adjustable in 1kV scale) 1 - 30kV (adjustable in 1kV scale) 1 - 30kV (adjustable in 1kV scale)
Electron Source Pre-Centred Tungsten Filament Pre-Centred Tungsten Filament Pre-Centred Tungsten Filament Pre-Centred Tungsten Filament
Detector SED(DP) SED(DP), EDS SED(DP), BSED(DP) SED(DP), BSED(DP), EDS
Sample Size 70mm (W) x 45mm (H) 70mm (W) x 45mm (H) 70mm (W) x 45mm (H) 70mm (W) x 45mm (H)
X-Y/T Traverse 35x35mm / 0 - 45º 35x35mm / 0 - 45º 35x35mm / 0 - 45º 35x35mm / 0 - 45º
Features Measurement Tool
Remote Control
Measurement Tool
Remote Control
Automation Focus, Filament, Brightness/Contrast Focus, Filament, Brightness/Contrast Focus, Filament, Brightness/Contrast Focus, Filament, Brightness/Contrast
Data Output Format jpg, tiff, BMP jpg, tiff, BMP jpg, tiff, BMP jpg, tiff, BMP
Dimensions 400 x 600 x 550 mm 400 x 600 x 550 mm 400 x 600 x 550 mm 400 x 600 x 550 mm
Weight 85 kgs 95 kgs 85 kgs 95 kgs
Options BSED
CoolStage
30mm Active Size Compact Type EDS (Particle Analysis)
30mm Active Size Compact Type EDS (MPO included)
BSED
CoolStage
STEM
CoolStage
Panorama 2.0
30mm Active Size Compact Type EDS (Particle Analysis)
30mm Active Size Compact Type EDS (MPO included)
STEM
CoolStage
Panorama 2.0
30mm Active Size Compact Type EDS (Particle Analysis)
30mm Active Size Compact Type EDS (MPO included)

Downloads

Brochures

EM-30N Brochure

View Brochure

Service Support

Comprehensive repairs and servicing

Annual Support Programs

Your metrology instrumentation is a major investment that is critical to your business operation and success. In today’s competitive climate, it is more important than ever to extend the functionality and peak performance of your metrology equipment years beyond the expiration of your factory warranty. CN Tech’s Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.

With over 20 years’ experience servicing and repairing you can be assured that your system is in safe hands. The independent services we offer include system relocation, maintenance visits, parts and consumables, and break down interventions.

CN Tech’s Support Programs are an economical way to guarantee optimal working condition:

  • Annual Preventive Maintenance
  • Priority Technical Assistance
  • Preferred Parts Availability
  • On-Site User Training
  • Remote Diagnostics
  • No surprise repair expense and much more!

Support Contact Example

An example of our service and support contracts are shown below:

Brochures

Metrology & Instrumentation Annual Support Programs 2022/23

CN Tech's Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.

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