EM-30N
The EM-30N can deliver clear images without noise, even at high magnification. The panorama feature enables the EM-30N to scan an even wider area. It's full compatibility with EDS (energy dispersive spectroscopy) delivers optimised performance.
Manufacturer
COXEM
COXEM manufactures and provides Scanning Electron Microscope (SEM), the most widely used platform technology in Nano- Metrology of Nano-scale. As a partner of Nano-fusion technology that changes industrial condition in 21 century, COXEM tries to provide the best quality service. SEM is the precision instrument, can be used for analysing the shapes or constituents of microstructure materials in quantitative and qualitative. SEM is an essential instrument for development of basic science and an indispensable infra for technical innovation, used in chemistry, biology, material science as well as nano-materials and nano-biology.
CN Tech are the exclusive Coxem distributor for:
United Kingdom and Republic of Ireland.
Key Features
- High magnification observation of images
- Dual display mode
- Micro, Macro, and Nano view
- Various methods for particle analysis
- Performs TEM analysis of samples on standard TEM grids
- Coolstage lowers temperature of sample to freeze internal moisture preventing damaging effects of vacuum on delicate microstructure
- Using low vacuum mode, you can get an image of non-conductive samples or insulating materials without involving any special treatment
- EDS can be used on up to 4 samples mounted simultaneously
Effect Of High Resolution
EM-30N boasts the advantage that it enables high magnification observation of images. Moreover, it can effectively get high-resolution images by adjusting the voltage, operational distance, and electronic beam size.
Dual Display / Signal Mixing Mode
Dual Display Mode
The dual display mode delivers SE and BSE images in a single-view presentation.
Signal Mixing Mode
Combining SE and BSE images provides a single-view access to the forms and chemical composition of samples.
Duplex Navi
The NanoStation interface provides multiple means of navigation simply by clicking within any of the three different magnified views:
1) A micro view using the CCD Navi Cam or Sample Holder map to move from sample to sample or areas of a large sample.
2) A micro view using the low magnification MiniMap image with a Field of View (FOV) indicator to move within a sample.
3) A nano view at the desired FOV allows movement by clicking in the image or using the Image Shift controls to make nanometre movements for perfect centring and alignment of sample features of interest.
Particle Analysis
Particle analysis can be done with various methods, and accurate analysis is ensured even for composite samples.
STEM Analysis
Coxem offers a true, retractable STEM detector enabling the EM-30N to perform TEM analysis of samples on standard TEM grids using our higher kV capability than other Tabletop SEM models. Imaging in both Bright and Dark field is possible as well as using EDS on up to 4 samples mounted simultaneously.
Coolstage
Performing SEM observations of moist samples requires a variety of pre-treatments such as critical point drying and fixation. To shorten such complex sample preparation procedures, the COXEM Coolstage lowers the temperature of the sample to freeze internal moisture preventing the damaging effects of vacuum on delicate microstructure.
Low Vacuum Mode
Using the low vacuum (LV) mode, it's easy to get an image of non-conductive samples or insulating materials without involving any special pre-treatment.
Dual Image / Signal Mixing Mode
Electron microscope can realise images by collecting the different signals generated from samples with electronic beam. The SE detector can get data as created by ruggedness by capturing secondary electrons (SE), and the backscattered electrons (BSE) collected with the BSE detector can get the elementary composition and stereoscopic images of the samples. It also performs signal merging, which presents the images of the forms and shapes of samples on a single screen.
Specifications
| Electron gun | Tungsten filament (W) |
| Spatial resolution | < 5nm |
| Photo magnification | 15x to 150,000x |
| Display magnification | 15x to 150,000x |
| Accelerating voltage | 1 ~ 30kV |
| Sample stage | X : 35mm, Y : 35mm, Tilt : 0 ~ 45° |
| Detector | SE, BSE* |
| Vacuum mode | HV, LV* |
| Vacuum system | Turbo pump (80L) + Rotary pump (100L) |
| Dimension (W × L × H) | 400(W) × 630(L) × 600(H)mm |
| Weight | 85kg |
| Features |
Panorama v1 Auto focus Auto brightness & contrast Auto start Signal mixing Dual display & Save Line profile Image filtering Annotation tool ChamberCam |
| Data output format | JPEG, TIFF, BMP |
| Options* |
BSE, EDS, EBSD, STEM NaviCam, Coolstage LV (20Pa), VP (10 / 20 / 30Pa) Panorama v2, Nanofibre Scanner Diaphragm pump |
Downloads
EM-30N Brochure
Related Products
Service Support
Comprehensive repairs and servicing
Annual Support Programs
Your metrology instrumentation is a major investment that is critical to your business operation and success. In today’s competitive climate, it is more important than ever to extend the functionality and peak performance of your metrology equipment years beyond the expiration of your factory warranty. CN Tech’s Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.
With over 20 years’ experience servicing and repairing you can be assured that your system is in safe hands. The independent services we offer include system relocation, maintenance visits, parts and consumables, and break down interventions.
CN Tech’s Support Programs are an economical way to guarantee optimal working condition:
- Annual Preventive Maintenance
- Priority Technical Assistance
- Preferred Parts Availability
- On-Site User Training
- Remote Diagnostics
- No surprise repair expense and much more!
Support Contact Example
An example of our service and support contracts are shown below:
Metrology & Instrumentation Annual Support Programs 2024/25
CN Tech's Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.