Electric Force Microscopy Mode

Electric Force Microscopy Mode (EFM) is an oscillating mode. A metal tip scans the surface to record the topography. Then, the tip is over the sample and recording the offsets of the phase signal of the interactions with the gradient of electrical forces present on the surface.

Manufacturer

CSI

CSInstruments is a French scientific equipment manufacturer specialised in the conception of Atomic Force Microscope and options designed for existing AFM (Nano-Observer AFM, Resiscope™, High Voltage Amplifier, Magnetic modules). The product range proposed by CSInstruments is designed and manufactured to help the scientific community to achieve nanometer performances that meet the research needs and requirements for actual and future nanoscience applications.

CSInstruments was founded by a team of experts working in AFM field for more than 20 years, starting as pioneer with some historical manufacturers. CSInstruments activity is also based on a qualified and dynamic team, experienced in the fields of mechanics, electronics and data processing. This expertise ensures innovation and performance in the production of AFM and achieves an excellent price/performance ratio!

Key Features

  • Electrical character-isation
  • Mapping of gradient electric field
  • High sensitivity of the phase signals and amplitude

Interests

Electric field gradient mapping

Electric Force Microscopy (EFM) measures electric field gradient distribution by measuring the electrostatic force between the surface and a biased AFM cantilever. It is used for electrical failure analysis detecting trapped charges mapping electric polarization and performing electrical read.

Benefits

  • Electrical characterisation
  • Mapping of gradient electric field
  • High sensitivity of the phase signals and amplitude

Electric Force Microscopy Mode Probes

Diamond Probes

  • DD-FORTA

High Resolution

  • CS-A-E2.8
Metal Coating
  • ANSCM-PT

Product range

Soft Intermittent Contact

Contact Mode

ResiScope Mode

Conductive AFM Mode

Force Modulation Mode

Piezoresponse Force Microscopy Mode

Oscillating Mode

Electric Force Microscopy Mode

Magnetic Force Microscopy Mode

VMFM – Variable Magnetic Field Module

Thermal Measurements AFM

Applications

  • Material Science

Industries

  • Materials Science
  • Life Sciences
  • Semiconductors and Electronics
  • Academics
  • Others (includes solar cells, geoscience, forensic science, and food technology)

 

If you would like to learn more about Electric Force Microscopy Mode, contact our experienced technical team today. We would be happy to help you find the right profilometry solution for your needs. Contact us today!