Contact Mode

A probe of nanometric size scans the surface using piezoelectric motors. Laser detection maintains a constant bending of the cantilever during the measurement. The movements of the vertical piezoelectric motor are recorded vertical to reconstruct the surface. Mapping of friction is performed with the torsion of the cantilever (LFM).



CSInstruments is a French scientific equipment manufacturer specialised in the conception of Atomic Force Microscope and options designed for existing AFM (Nano-Observer AFM, Resiscope™, High Voltage Amplifier, Magnetic modules). The product range proposed by CSInstruments is designed and manufactured to help the scientific community to achieve nanometer performances that meet the research needs and requirements for actual and future nanoscience applications.

CSInstruments was founded by a team of experts working in AFM field for more than 20 years, starting as pioneer with some historical manufacturers. CSInstruments activity is also based on a qualified and dynamic team, experienced in the fields of mechanics, electronics and data processing. This expertise ensures innovation and performance in the production of AFM and achieves an excellent price/performance ratio!

Key Features

  • Piezoelectric motors
  • Laser detection
  • High resolution
  • Force curve
  • Deflection & friction signals


Deflection & friction signals

AFM contact mode allows rapid measurements on any sample type. The signals issue from the horizontal photo detectors contributes to the study of friction between the tip and the sample. The forces applied to the surface depend on the constant stiffness constant of the cantilever. These forces also vary as a function of the setpoint value which allows the study of friction as a function of the force applied. The force curves will help the study of local mechanical properties such as adhesion and stiffness.


  • High resolution
  • Force curve
  • Deflection & friction signals

Associated modes

  • Conductive AFM  
  • ResiScope  
  • Force Modulation  
  • MFM mode  

Contact Mode Probes

Top image: ACCESS-C

Middle image: HYDRA-ALL

Bottom image: CM12/28, FM60, FORTC

Product range

Soft Intermittent Contact

Contact Mode

ResiScope Mode

Conductive AFM Mode

Force Modulation Mode

Piezoresponse Force Microscopy Mode

Oscillating Mode

Electric Force Microscopy Mode

Magnetic Force Microscopy Mode

VMFM – Variable Magnetic Field Module

Thermal Measurements AFM


  • Semiconductor
  • Polymer
  • Nanotubes
  • Organic materials
  • Nanostructure


  • Materials Science
  • Life Sciences
  • Semiconductors and Electronics
  • Academics
  • Others (includes solar cells, geoscience, forensic science, and food technology)


If you would like to learn more about Contact Mode, contact our experienced technical team today. We would be happy to help you find the right profilometry solution for your needs. Contact us today!