Conductive AFM Mode

Conductive AFM Mode

The conductive AFM (C-AFM) is an AFM contact mode. A conductive probe saves the current variations of the surface using an amplifier. It can be kept at one location while the voltage and current signals are applied, or it can be moved to scan a specific region of the sample under a constant voltage.

Manufacturer

CSI

CSInstruments is a French scientific equipment manufacturer specialised in the conception of Atomic Force Microscope and options designed for existing AFM (Nano-Observer AFM, Resiscope™, High Voltage Amplifier, Magnetic modules). The product range proposed by CSInstruments is designed and manufactured to help the scientific community to achieve nanometre performances that meet the research needs and requirements for actual and future nanoscience applications.

CSInstruments was founded by a team of experts working in AFM field for more than 20 years, starting as pioneer with some historical manufacturers. CSInstruments activity is also based on a qualified and dynamic team, experienced in the fields of mechanics, electronics and data processing. This expertise ensures innovation and performance in the production of AFM and achieves an excellent price/performance ratio!

Key Features

  • Great sensitivity of the current amplifier
  • Saves the current variations of the surface using an amplifier
  • Can be kept at one location while the voltage and current signals are applied
  • Can be moved to scan a specific region of the sample under a constant voltage

Interests

Current mapping

Conductive AFM (C-AFM) is powerful current-sensing technique. The fact that the C-AFM uses two different detection systems (optical for the topography and amplifier for the current) is a strong advantage compared to scanning tunnelling microscopy (STM). Indeed the C-AFM measures the conductivity at a given point and not the current flowing between the tip and the sample.

Benefits

  • Current mapping  
  • Great sensitivity of the current amplifier  
  • Expert mode spectroscopic
    – Current/ voltage curves (I/V)
    – Force curve simultaneously

Conductive AFM Mode Probes

Diamond Probes

  • DD-ACTA    
  • DD-FORTA

High Resolution

  • CS-A-E2.8    
  • CS-A-E40    
  • CS-FM-LC    
  • CS-NC-LC
Metal Coating
  • ANSCM-PC    
  • ANSCM-PT

Industries

  • Materials Science
  • Life Sciences
  • Semiconductors and Electronics
  • Academics
  • Others (includes solar cells, geoscience, forensic science, and food technology)

 

Applications

Semiconductor

Polymer

Nanotubes

Organic materials

Nanostructure

Service Support

Comprehensive repairs and servicing

Annual Support Programs

Your metrology instrumentation is a major investment that is critical to your business operation and success. In today’s competitive climate, it is more important than ever to extend the functionality and peak performance of your metrology equipment years beyond the expiration of your factory warranty. CN Tech’s Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.

With over 20 years’ experience servicing and repairing you can be assured that your system is in safe hands. The independent services we offer include system relocation, maintenance visits, parts and consumables, and break down interventions.

CN Tech’s Support Programs are an economical way to guarantee optimal working condition:

  • Annual Preventive Maintenance
  • Priority Technical Assistance
  • Preferred Parts Availability
  • On-Site User Training
  • Remote Diagnostics
  • No surprise repair expense and much more!

Support Contact Example

An example of our service and support contracts are shown below:

Brochures

Metrology & Instrumentation Annual Support Programs 2024/25

CN Tech's Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.

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