Conductive AFM (C-AFM) is powerful current-sensing technique. The fact that the C-AFM uses two different detection systems (optical for the topography and amplifier for the current) is a strong advantage compared to scanning tunneling microscopy (STM). Indeed the C-AFM measures the conductivity at a given point and not the current flowing between the tip and the sample.
- Current mapping
- Great sensitivity of the current amplifier
- Expert mode spectroscopic
– Current/ voltage curves (I/V)
– Force curve simultaneously