Conductive AFM mode

The conductive AFM (C-AFM) is an AFM contact mode. A conductive probe saves the current variations of the surface using an amplifier. It can be kept at one location while the voltage and current signals are applied, or it can be moved to scan a specific region of the sample under a constant voltage.

Manufacturer

CSI

CSInstruments is a French scientific equipment manufacturer specialised in the conception of Atomic Force Microscope and options designed for existing AFM (Nano-Observer AFM, Resiscope™, High Voltage Amplifier, Magnetic modules). The product range proposed by CSInstruments is designed and manufactured to help the scientific community to achieve nanometer performances that meet the research needs and requirements for actual and future nanoscience applications.

CSInstruments was founded by a team of experts working in AFM field for more than 20 years, starting as pioneer with some historical manufacturers. CSInstruments activity is also based on a qualified and dynamic team, experienced in the fields of mechanics, electronics and data processing. This expertise ensures innovation and performance in the production of AFM and achieves an excellent price/performance ratio!

Key Features

  • Saves the current variations of the surface using an amplifier
  • Can be kept at one location while the voltage and current signals are applied
  • Can be moved to scan a specific region of the sample under a constant voltage
  • Current mapping
  • Great sensitivity of the current amplifier
  • Expert mode spectroscopic – Current/ voltage curves (I/V) – Force curve simultaneously

Interests

Current mapping

Conductive AFM (C-AFM) is powerful current-sensing technique. The fact that the C-AFM uses two different detection systems (optical for the topography and amplifier for the current) is a strong advantage compared to scanning tunneling microscopy (STM).  Indeed the C-AFM measures the conductivity at a given point and not the current flowing between the tip and the sample.

Benefits

  • Current mapping  
  • Great sensitivity of the current amplifier  
  • Expert mode spectroscopic
    – Current/ voltage curves (I/V)
    – Force curve simultaneously

Conductive AFM Mode Probes

Diamond Probes

  • DD-ACTA    
  • DD-FORTA

High Resolution

  • CS-A-E2.8    
  • CS-A-E40    
  • CS-FM-LC    
  • CS-NC-LC
Metal Coating
  • ANSCM-PC    
  • ANSCM-PT

Product range

Soft Intermittent Contact

Contact Mode

ResiScope Mode

Conductive AFM Mode

Force Modulation Mode

Piezoresponse Force Microscopy Mode

Oscillating Mode

Electric Force Microscopy Mode

Magnetic Force Microscopy Mode

VMFM – Variable Magnetic Field Module

Thermal Measurements AFM

Applications

  • Semiconductor
  • Polymer
  • Nanotubes
  • Organic materials
  • Nanostructure

Industries

  • Materials Science
  • Life Sciences
  • Semiconductors and Electronics
  • Academics
  • Others (includes solar cells, geoscience, forensic science, and food technology)

 

If you would like to learn more about Conductive AFM Mode, contact our experienced technical team today. We would be happy to help you find the right profilometry solution for your needs. Contact us today!