BSE Detector
Backscattered electrons (BSEs) are high-energy electrons generated as a result of elastic interactions between the primary electron beam and the sample.
Manufacturer
COXEM
COXEM manufactures and provides Scanning Electron Microscope (SEM), the most widely used platform technology in Nano- Metrology of Nano-scale. As a partner of Nano-fusion technology that changes industrial condition in 21 century, COXEM tries to provide the best quality service. SEM is the precision instrument, can be used for analysing the shapes or constituents of microstructure materials in quantitative and qualitative. SEM is an essential instrument for development of basic science and an indispensable infra for technical innovation, used in chemistry, biology, material science as well as nano-materials and nano-biology.
CN Tech are the exclusive Coxem distributor for:
United Kingdom and Republic of Ireland.
Key Features
- Clear Image about the boundary of metal
- Option for both EM Series and CX Series
- Easy controlled S/W by Digital board
- Clear Image of Non-Coating Specimen with LV mode
Specifications
| Resolution | 10nm |
| Channels | 4 channels solid type |
| Image | Topography and composition functions, Dual display |