AZtecOne & X-act EDS System

AZtecOne is an easy to use but powerful solution for Energy Dispersive Spectroscopy (EDS) in SEMs. An accurate and featureful, yet simple materials characterisation system, AZtecOne is an elemental microanalysis solution with proven reliability.


Oxford Instruments

Oxford Instruments plc is a leading provider of high technology products and services to the world's leading industrial companies and scientific research communities. Our core purpose is to support our customers to address some of the world's most pressing challenges, enabling a greener economy, increased connectivity, improved health and leaps in scientific understanding. We are proud to be recognised as the leaders in what we do and for the difference we make in the world.

Key Features

  • X-ray Mapping
  • X-ray Linescanning
  • Spectrum Acquisition
  • Fast Reporting
  • Reliable & Accurate SDD

Oxford Instruments AztecOne

The AZtecOne Energy Dispersive Spectroscopy (EDS) System from Oxford Instruments is a simple and efficient solution for conducting EDS analysis. Powerful yet simple to use, AZtecOne provides a materials characterisation capability with proven stability and accuracy. AZtecOne EDS can be optionally integrated with a COXEM scanning electron microscope, to provide a combined solution for both SEM imaging and materials analysis.

Energy-dispersive X-ray spectroscopy (EDS, EDX, or EDXS) is an essential method for performing elemental analysis on samples. EDS techniques can be applied in-situ inside the chamber of an electron microscope.

The AZtecOne system consists of the intuitive AZtecOne software, and Oxford Instrument's highly accurate x-act Silicon Drift Detector (SDD). Oxford Instruments have designed AZtecOne to be fully compatible with COXEM's CX-200 Plus SEM.

Simple and Efficient

With AZtecOne, it is quick and easy to perform EDS analysis, however experienced the user is with using EDS technology. Accurate, informative results can be delivered rapidly with the streamlined and intuitive user interface of AZtecOne. A new user can be trained in minutes, and will be able to acquire images and produce reports in seconds.

X-Ray Mapping

The chemical distribution of a sample can be easily visualised with AZtecOne's X-ray mapping. A layered image, labelled with a colour key, visualises in a single image the phase and element distribution.

Common artefacts can be eliminated by the advanced TruMap functionality, which ensures a sample's true element distribution is shown. By separating spectra with overlapping peaks, false information is eliminated and accuracy improved.

X-Ray Linescanning

The variation of elemental composition along a line can be visualised with X-ray Linescanning. Major and trace elements can be compared by normalising the display, and performing multiple linescans can be automated.

Spectrum Acquisition

AZtecOne is powered by Oxford Instrument's Tru-Q technology, which provides greater analysis detail. By automatically detecting and identifying elements, Tru-Q enhances efficiency and improves quantified results. The MiniQuant viewer displays sample composition instantly, and acquisitions can be made from points, rectangular, circular or freehand regions.

Report Generation

Reports can be generated quickly and easily from the AZtecOne software. Data selection and report design can all be customised, and exported in a range of formats.

x-act SDD

  • 10mm2Chip Size
  • <133ev Resolution

Oxford Instrument's x-act Silicon Drift Detector (SDD) is a proven and reliable instrument for delivering accurate quantitative results at all count rates. A fully quantative SDD, the x-act provides all the benefits of Oxford Instrument's renowned technology. Featuring a detector chip size of 10mm2, and resolution of <133eV. Peak position guaranteed to change no more than 1 eV between 1,000 cps and 100,000 cps.



AZtecOne & x-act EDS System Brochure

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Service Support

Comprehensive repairs and servicing

Annual Support Programs

Your metrology instrumentation is a major investment that is critical to your business operation and success. In today’s competitive climate, it is more important than ever to extend the functionality and peak performance of your metrology equipment years beyond the expiration of your factory warranty. CN Tech’s Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.

With over 20 years’ experience servicing and repairing you can be assured that your system is in safe hands. The independent services we offer include system relocation, maintenance visits, parts and consumables, and break down interventions.

CN Tech’s Support Programs are an economical way to guarantee optimal working condition:

  • Annual Preventive Maintenance
  • Priority Technical Assistance
  • Preferred Parts Availability
  • On-Site User Training
  • Remote Diagnostics
  • No surprise repair expense and much more!

Support Contact Example

An example of our service and support contracts are shown below:


Metrology & Instrumentation Annual Support Programs 2022/23

CN Tech's Support Programs will help ensure that your investment is protected, and that you and your instrument’s are always operating at peak performance.

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