Atomic Force Microscope Galaxy Dual Controller

The GALAXY DUAL controller creates new opportunities for AFM users by combining new features with those already available on your existing AFM. This new controller offers more than a second life to your AFM, it renews and improves the performance with new imaging modes and new intuitive software.



CSInstruments is a French scientific equipment manufacturer specialised in the conception of Atomic Force Microscope and options designed for existing AFM (Nano-Observer AFM, Resiscope™, High Voltage Amplifier, Magnetic modules). The product range proposed by CSInstruments is designed and manufactured to help the scientific community to achieve nanometer performances that meet the research needs and requirements for actual and future nanoscience applications.

CSInstruments was founded by a team of experts working in AFM field for more than 20 years, starting as pioneer with some historical manufacturers. CSInstruments activity is also based on a qualified and dynamic team, experienced in the fields of mechanics, electronics and data processing. This expertise ensures innovation and performance in the production of AFM and achieves an excellent price/performance ratio!

Key Features

  • Creates new opportunities for AFM users
  • Combines new features with those already available on your existing AFM
  • Renews and improves performance to your AFM
  • New imaging modes and intuitive software
  • Offers a real integrated lock-in for better measurement capability (phase detection, field measurement)
  • Low-noise electronics and power supply
  • 24bit drive architecture provides high resolution and smart integration

Keep your existing AFM modes

The dual galaxy controller has been designed to be fully compatible with:
– Multimode AFM
– Pico SPM (STM)
– 5100 AFM
– 5500 AFM
– STM, Contact, AC, Phase, MFM/ EFM/ PFM,/LFM, EC modes

Add new advanced modes

No lift, much higher sensitivity & resolution.

ResiScope & Soft ResiScope
Resistance & current, from 10² to 1012 ohms, also on soft samples.

Soft Intermittent contact mode
Adhesion, Stiffness, youngs modulus, constant force = quantitative measurement.

High-definition AFM imagery finally accessible to everyone in a few seconds

User-Friendly Interface
The NanoSolution user interface is very intuitive and versatile:

  • AFM mode selection quickly and automatically configures the electronics in just one click requiring no help from the user.
  • The interface composed of clickable buttons and a guided workflow allows easy configuration of the AFM for efficient image acquisition.
  • The top view allows for simple laser alignment and adjustment by displaying a view of the laser reflection on the tip.
  • The side view allows a really easy pre-approach without damage to the tip and sample.
  • The auto setting allows the user to obtain an AFM image in just a few clicks while access to the parameters gives an expert the opportunity to exercise all of the AFM’s capabilities for a very high quality image.

Software Designed for Everyone: Performance and Versatility

Whether the user is new or experienced, whether AFM needs are focused on academic research or industry, NanoSolution is a software suitable for everyone.
The ultra fast automated mode allows inexperienced users to produce a quality image very easily and with less support. All the user needs to do is to follow the workflow instructions for configuring the AFM and launch the scan in 1 click.

  • Auto tune
  • Auto approach
  • Auto gain
  • Auto predefined setpoint AFM condition

In parallel, the manual mode which requires advanced experimentation and requires increased knowledge in the acquisition of an image, offers high control and gives access to all the functions and adjustments necessary so that the most experienced users can refine their results and generate high quality images usable for their analyses.


Advanced spectroscopy

In addition to the standard spectroscopy parameters, the Nanosolution software has unique functions specially created for force curve spectroscopy.

  • The FLEX GRID allows the user to select several points to obtain during the scan and the force curves at the coordinates selected. An interactive file will then allow him to positioned curve on topography (or other signal).
  • The FIXED STEP GRID allows the user to obtain a force curve mapping configured in number of points per line.
  • The EXPERT CURVE CONTROL is segment programming of the displacement of the probe in Z with different parameters: speed, resolution or even duration.

These unique functions make NanoSolution a powerful software for force curves.

Product range

Nano-Observer Atomic Force Microscope
Galaxy Dual Controller Atomic Force Microscope


  • Material characterisation
  • Polymer science
  • Electrical characterization
  • Semiconductor
  • Soft sample
  • Biology


  • Materials Science
  • Life Sciences
  • Semiconductors and Electronics
  • Academics
  • Others (includes solar cells, geoscience, forensic science, and food technology)


If you would like to learn more about the Atomic Force Microscope Galaxy Dual Controller, contact our experienced technical team today. We would be happy to help you find the right profilometry solution for your needs. Contact us today!