AFM Environmental Control

The Nano-Observer AFM is compatible with a controlled environment during the image aquisition. With the Atmosphere control accessory, it is possible to isolate the volume inside the AFM, introduce an inert gas or control the relative humidity.

Manufacturer

CSI

CSInstruments is a French scientific equipment manufacturer specialised in the conception of Atomic Force Microscope and options designed for existing AFM (Nano-Observer AFM, Resiscope™, High Voltage Amplifier, Magnetic modules). The product range proposed by CSInstruments is designed and manufactured to help the scientific community to achieve nanometer performances that meet the research needs and requirements for actual and future nanoscience applications.

CSInstruments was founded by a team of experts working in AFM field for more than 20 years, starting as pioneer with some historical manufacturers. CSInstruments activity is also based on a qualified and dynamic team, experienced in the fields of mechanics, electronics and data processing. This expertise ensures innovation and performance in the production of AFM and achieves an excellent price/performance ratio!

Key Features

  • Isolate the volume inside the AFM
  • Introduce an inert gas or control the relative humidity
  • Allow a fast and rapid control of the changes in RH
  • Small AFM allowing easy integration into a glove box or passage through the airlock
  • Probe mounting outside of the glove box
  • No cables or connectors to manipulate (everything is controlled by software)
  • No contamination of samples
  • Prevents the contamination
  • Stable measurement for electrical characterisation
  • Atmosphere volume : 451 cm3

Environmental control

Setting the relative humidity to values close to 0% inside the chamber is vital to have reproducible results when using electrical modes such as HD-KFM, ResiScope, SMIM, EFM,.. in order to avoid effects of local oxidation due to the presence of water layers on the surface. In the case of experiments of local-probe anodic oxidation, it is required to have a precise and reproducible control of the relative humidity (RH) during the study of oxidation kinetics. The small volume of the atmosphere control accessory, together with the diffusors in the gas inlet of the Nano-Observer AFM, allow a fast and rapid control of the changes in RH.

Nano-Observer AFM in Glovebox

Exploring the properties of many materials requires working in a controlled environment to protect the samples from environmental influences (2D, organic or photovoltaic materials).  

The Nano-Observer AFM perfectly matches to this type of request:  

  • Small AFM allowing easy integration into a glove box or passage through the airlock  
  • Probe mounting outside of the glove box  
  • No cables or connectors to manipulate (everything is controlled by software)  
  • No contamination of samples

The installation presented in this glove box consists of the Nano-Observer AFM, an anti-vibration table and an acoustic isolation box.

This implementation considerably reduces external interference, sample contamination and improves the accuracy of the results.

Interests

Prevent contamination & stable measurements  

The Nano-Observer is designed to offer environmental control (gas, humidity…) to improve your electrical measurements or protect your sample from oxidation.

Benefits    

  • Prevents the contamination    
  • Stable measurement for electrical characterisation    
  • Atmosphere volume : 451 cm3

Other AFM environments

EZ liquids
Measurements in liquid

EZ Temp
Temperature control

Product range

- Environmental Control  
- EZ Liquids  
- EZ Temperature  

Applications

  • Electrical measurements :ResiScope, CAFM, HD-KFM
  • Humidity control
  • Probe-induced local oxidation.

Industries

  • Materials Science
  • Life Sciences
  • Semiconductors and Electronics
  • Academics
  • Others (includes solar cells, geoscience, forensic science, and food technology)

 

If you would like to learn more about AFM Environmental Control, contact our experienced technical team today. We would be happy to help you find the right profilometry solution for your needs. Contact us today!