Electron Backscatter Diffraction (EBSD) is continuously evolving, and the for the past 20 years the Royal Microscopy Society have organised an annual EBSD meeting to discuss the latest breakthroughs. The annual EBSD meeting regularly brings together leading scientists and engineers working with EBSD from around the world.
This year, a range of EBSD applications will be discussed, from geoscience and engineering to biological sciences. Talks regularly cover recent developments in EBSD instrumentation and software. New and novel applications of EBSD, electron channelling contrast imaging (ECCI), transmission Kikuchi diffraction and other relevant topics will also be discussed.
A workshop exploring data analysis and EBSD, including pattern and orientation analysis will also be held for attendees to participate in.
CN Tech is excited to be attending this year, and sharing with attendees the Swift Instruments range of in-situ tensile stages. Finding a perfect solution for tensile testing inside a scanning electron microscope can be challenging. Swift Instruments have developed a range of fully customisable miniature tensile stages to suit any SEM and application.
We will be holding a short presentation on the Swift Instruments tensile stage range during EBSD 2019, and a demonstration stage will be on display for visitors to examine. Our representatives will be on hand to discuss our EBSD and electron microscopy solutions. Alongside tensile stages, CN Tech also offer SEM systems from COXEM, with options for integrated Oxford Instruments EBSD and EDS.
The EBSD 2019 meeting will be held at the National Physical Laboratory (NPL) in Teddington, greater London on Tuesday 2nd to Wednesday 3rd April 2019. For more information, or to register for the meeting please visit the RMS website. To learn more about our EBSD and SEM solutions, please explore Tensile Testing and COXEM SEM areas of our website.