CN Tech at MSM-XXI Conference

CN Tech is exhibiting at the International Conference on Microscopy of Semiconducting Materials at Fitzwilliam College in Cambridge. This is the 21st time that the biennial MSM conference has been held to discuss the latest advances in imaging and analysis for semiconductor materials. A range of talks are being held, alongside social activities and a commercial exhibition. To learn more about MSM-XXI, please visit the Institute of Physics website, which includes the full programme.

Our team is on hand to share our wide range of microscopy and surface analysis solutions with delegates. An NX10 Atomic Force Microscope from Park Systems is being demonstrated at our stand, which provides advanced nanoscale thin film and electrical property characterisation. Learn more on the Park Systems NX10 AFM page on our website. We are also happy to discuss our electron microscopy and surface profilometry solutions with attendees.

We hope we can meet you here!

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