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Nano Indenter® G200X

Product Features

Key Features

  • Upgradeable & Extendable Design
  • Fast Data Acquisition Up To 100kHz
  • High Load Capability Up To 10N
  • ISO 14577 Compliant Testing
  • Fast Indentation with NanoBlitz 3D
  • Scratch & Wear Testing
KLA G200X nanoindenter, with an example image

Precise Mechanical Testing for Micro-To-Nano Range of Loads & Displacements

The Nano Indenter® G200X system is an accurate, flexible, user-friendly instrument for nanoscale mechanical testing. The Nano Indenter G200X measures Young’s modulus and hardness, including measurement of deformation over six orders of magnitude (from nanometers to millimeters). The system can also measure the complex modulus of polymers, gels and biological tissue, as well as the creep response (strain rate sensitivity) of thin metallic films. Modular system options can accommodate a variety of applications: frequency-specific testing, quantitative scratch and wear testing, integrated probe-based imaging, high-temperature testing, expanded load capacity up to 10N, and custom test protocols.

KLA Core Technology

The Nano Indenter G200X is powered by electromagnetic transducers to deliver precise measurements and avoid artifacts in the x and y axes. The system is designed to provide accurate sample positioning, easy sample viewing, and simple sample height adjustment. In its standard configuration, the G200X utilizes the XP indentation head, and a modular controller that allows users to add capabilities as needed. In addition, the G200X gives users the ability to program each transducer for specific measurements, and switch between them at any time. The system has a small footprint to conserve lab space and conforms to ISO 14577 to ensure data integrity.

The G200X system provides a wide array of imaging capabilities, including a survey scanning mode that is ideal for scratch and wear testing on large samples, or for working with large, irregularly-shaped, and/or heterogeneous samples.

Continuous Stiffness Measurement (CSM)

The CSM option measures stiffness during the indentation cycle to measure material properties as a function of depth, force, time or frequency.

AccuFilmTM allows for characterization of ultra-thin films by correcting for substrate influence on the measurement

ProbeDMATM enables dynamic mechanical analyses (DMA) on soft polymers and other materials with sample geometries and/or material volumes that are not suitable for standard DMA tests

Biomaterials Method Pack provides the ability to measure the complex modulus of biomaterials with shear moduli on the order of 1kPa . Utilizing the CSM module, the pack includes a flat-punch tip and a test method for evaluation of viscoelastic properties

NanoBlitz 3D Rapid Mechanical Property Mapping

Quickly and quantitatively maps surface mechanical properties
Gives statistically significant results due to the increased number of observations
Measures rough surfaces and/or heterogeneous materials

The NanoBlitz 3D option measures elastic modulus and hardness as a function of (x, y) position, generating thousands of data points in a short period of time. The quantitative data is combined with powerful visualization techniques to assess differences in microstructure and gradients in mechanical properties.

NanoBlitz 4D Mechanical Property Tomography

Extends the Continuous Stiffness Measurement (CSM) technique to include mechanical property tomography

To assess elastic modulus and hardness as a function of (x, y) position and depth, NanoBlitz 4D option rapidly creates a user-defined array of constant strain rate indents using the CSM module. Because each indent is performed in about 7 seconds, the system can generate a statistically significant amount of data to accurately characterize complex microstructures and components.

Lateral Force Measurement (LFM) Option

The Lateral Force Measurement (LFM) option provides three-dimensional quantitative analysis for scratch testing, wear testing and MEMS probing by enabling shear force measurement in the x and y directions. Tribological studies benefit greatly from the LFM option, for determination of the critical load and coefficient of friction over the scratch length. Scratch testing applies a constant or ramped load to an indenter while moving across the sample surface, and can be used for thin films, brittle ceramics and polymers.

Scanning Probe Microscopy Options

NanoVision Stage

Featuring a closed-loop nanopositioning stage for high-resolution 3D imaging and precise targeting, NanoVision allows users to target indentation test sites with nanometer-scale precision and characterize individual phases of complex materials. NanoVision users can also examine residual impressions to quantify material response phenomena such as pile-up, deformed volume and fracture toughness.

Survey Scanning

The Survey Scanning option utilizes the accurate, repeatable (x, y) motion of the Nano Indenter G200X system to provide a maximum scan size of 500μm by 500μm. The NanoVision stage and Survey Scanning options can be used together for precise location targeting for nanoindentation tests, particularly valuable for determination of sample fracture toughness.

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