F32 Series In-Line Thin Film Analysers
- Improves Productivity
- Accurate Greater Than ±1%
- Fast Measurement in Seconds
- Non-Invasive Measurement
- Easy to Operate
- Turn-Key Setup
A Compact Solution for Comprehensive In-Line Measurement
The Filmetrics F32 series of in-line thin film analysers provides a quick and easy measurement method for production workflows. The F32 technology uses spectral analysis of reflectance from the top and bottom of a film to generate thickness information in real time. The F32 is available in a range of models supporting a variety of thickness ranges.
The F32 series system is compact, fitting into a half-width 3U rack mountable chassis. Up to 4 measurement locations can be monitored. Measurement can be controlled through external digital control, and measurement data can eb exported for statistical process control.
Filmetrics’ FILMeasure software includes a library of over 130 preconfigured materials, and has access to thousands more. New materials can also be added. This makes the F32 series simple to integrate into existing workflows.
Thickness Range Model Specifications
|Model||Thickness Range*||Wavelength Range|
|F32||15nm - 70µm||380-1050nm|
|F32-EXR||15nm - 250µm||380-1700nm|
|F32-NIR||100nm - 250µm||950-1700nm|
|F32-UV||1nm - 40µm||190-1100nm|
|F32-UVX||1nm - 250µm||190-1700nm|
|F32-XT||0.2µm - 450µm||1440-1690nm|
|F32-sX Series||10µm- 3mm||960-1580nm|
* Film Stack Dependant
Filmetrics F32 Series Thin Film Analyser Data Sheet