F3-CS Series Single Spot Thin Film Analysers
- Intuitive Analysis Software
- 100μm Spot Size
- Measure Thicknesses 3nm - 250μm
- Multiple Spectrometer Wavelength Ranges
- Measures in Seconds
- Modular & Expandable
Fast Measurement for Small Samples
Designed for measuring small samples, the Filmstrips F3-CS series of thin film measurement tools provide a fast and simple solution for film measurement. With minimal training, even inexperienced users can quickly measure layers such as parylene and vacuum coatings. Filmetrics’ measurement technology can measure in seconds.
To measure a small witness or coupon sample, a user simply places it face down on the measurement stage, and layer thicknesses are automatically measured. Filmetrics’ AutoBaseline technology automatically adjusts instrument sensitivity to minimise setup time. Hundreds of types of layers are support, on both opaque and transparent substrates.
Intuitive Software Makes Measurement Easy
With Filmetrics’ FILMeasure software, making accurate measurements in simple and easy. The optical constants for all common dialectric and semiconductor layers, such as parylene C, N and HT, are included in the software. Thickness measurement results are displayed in real time as samples are measured.
Each Filmetrics measurement system is backed by comprehensive technical and applications support, including online diagnostics and assistance. Filmetrics support is available 24 hours a day.
Thickness Range Model Specifications
|Model||Thickness Range*||Wavelength Range|
|F3-CS||15nm - 70µm**||380-1050nm|
|F3-CS-UV||3nm - 40µm**||190-1100nm|
|F3-CS-NIR||100nm - 250µm**||950-1700nm|
* Film Stack Dependent
** Thickness & Index Solving are Optional
Filmetrics F3-CS Series Thin Film Analyser Data Sheet