F20 Series Single Spot Thin Film Analysers
- Intuitive Analysis Software
- 1.5mm to 20μm Spot Size
- Large Material Reference Library
- Wide Spectrometer Wavelength Range
- Measures in Under a Second
- Modular & Expandable
Comprehensive Film Measurement
The F-20 Series of desktop film thickness measurement tools provide comprehensive capabilities for general purpose film measurement. Simple and easy to use, Filmterics’ measurement technology is also fast, measuring thickness and refractive index in under a second. The F-20 Series is available with a variety of thickness ranges to suit a wide range of measurement applications.
A wide range of accessories are available to customise the F-20’s capabilities. Every Filmetrics measurement system also comes with access to Filmetrics’ comprehensive technical and applications support, including online assistance.
Software Designed with users in Mind
To make film measurement as easy and straightforward as possible, Filmetri’cs have developed the FILMeasure software package. FILMeasre is simple and easy to use, making film measurement fast and intuitive. A library over 130 materials is included, with thousands more also available. The refractive index values of new materials can also be measured and stored, and Filmetrics’ technical support can assist with setting up new and novel materials.
For repeated measurement processes, such as quality control applications, recipes can be programmed and secured. This helps ensure reliability of repeated measurement and safeguard against user error.
Thickness Range Model Specifications
|Model||Thickness Range*||Wavelength Range|
|F20||15nm - 70µm||380-1050nm|
|F20-EXR||15nm - 250µm||380-1700nm|
|F20-NIR||100nm - 250µm||950-1700nm|
|F20-UV||1nm - 40µm||190-1100nm|
|F20-UVX||1nm - 250µm||190-1700nm|
|F20-XT||0.2µm - 450µm||1440-1690nm|
* Film Stack Dependant
Filmetrics F20 Series Thin Film Analyser Data Sheet