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Dynamic Cantilever CalibratorQuantitative AFM methods of measuring local mechanical and electric properties are based on knowing the probe characteristics and microscope performance, which is a non-trivial issue in existing scanning probe microscopes. To aid this, the Dynamic Cantilever Calibrator has been developed to measure the spring constant and inverse optical sensitivity.
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Phoenix AFM ControllerThe new Phoenix AFM Controller has been developed to expand the functionality of scanning probe microscopes.
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