Top products in this category

Items 13 to 24 of 27 total
    ZETA-300 Precision Surface Metrology Optical Profiler
    The Zeta-300 is an advanced optical profiler designed to provide maximum configuration flexibility and enhanced measurement sensitivity and repeatability. The low noise floor of the Zeta-300 makes it suitable for nm level step height and roughness measurements.
    ZETA-20 True Colour 3D Optical Profiler
    The Zeta-20 3D optical profiler provides Exceptional 3D imaging and metrology. Based on proprietary ZDot technology, the Zeta-20 images and analyzes surface features on samples of all types: smooth to rough, low reflectivity to high reflectivity, transparent to opaque. All hardware is easy to install and easy to use.
    P-7 Stylus Profiler
    The KLA P-7 Stylus Profiler offers industry leading measurement readability for reliable measurement performance. With a 150 mm scan stage as standard, the P-7 is the only stylus profiler on the market offering long scan capability without stitching. A 2 µm radius stylus is standard, with options for sub-micron to 25 µm radii available.
    Express Test Option
    Designed exclusively for use with the KLA Nano Indenter G200 DCM II & XP heads and stages, Express Test allows up to 100 indents to be performed at 100 different surface sites in 100 seconds.
    Laser Heater
    This new, easy-to-use G200 system solution utilizes a precise high-power diode laser to heat both the stage and sample. Advantages include the ability to measure nanomechanical properties at precisely controlled temperatures and to test samples under highly dynamic temperature conditions.
    Heating Stage
    The heating stage facilitates the study of materials of interest as they are heated from room temperature to as high as 350°C.
    The KLA NanoVision nanomechanical microscopy option delivers quantitative imaging by coupling a linear electromagnetic actuation-based indentation head with a closed-loop nanopositioning stage.
    High Load
    The KLA High Load option expands the load capabilities of KLA Nano Indenters up to 10 N of force, allowing the complete mechanical characterization of ceramics, bulk metals, and composites.
    New Enhanced Dynamic Contact Module (DCM II)
    The Dynamic Contact Module II (DCM II) option offers all of the impressive performance afforded by KLA's original DCM option as well as several new advantages, including 3x higher loading capability, easy tip exchange for quick removal and installation of application-specific tips, and a wider range of indenter travel.
    New Enhanced NanoSuite 6.1 Software
    KLA NanoSuite 6.1 is a premium-performance software package designed for use with KLA Nano Indenter G200 and gives researchers in scientific and industrial settings an unprecedented combination of speed, flexibility, and ease of use for nanoindentation.
    Lateral Force Measurement (LFM)
    The KLA Lateral Force Measurement (LFM) option for use with the standard XP head provides three-dimensional quantitative analysis for scratch testing, wear testing, and MEMS probing.
    Continuous Stiffness Measurement (CSM)
    The KLA Continuous Stiffness Measurement (CSM) option satisfies application requirements that must take into account dynamic effects, such as strain rate and frequency. CSM is a powerful tool not only for stiff materials such as metals, alloys, and ceramics but also for time-dependent materials like polymers, structural composites, and biomedical materials.
Items 13 to 24 of 27 total

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